S. Chatterjee, Y. Kuo, J. Lu, J.-Y. Tewg, P. Majhi Electrical reliability aspects of HfO2 high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:1, pp:69-76 [Journal]
Yao Zhao, Mingzhen Xu, Changhua Tan Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET degradation under different stress modes. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:1, pp:164-168 [Journal]
A. Caddemi, G. Crupi, N. Donato Temperature effects on DC and small signal RF performance of AlGaAs/GaAs HEMTs. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:1, pp:169-173 [Journal]
Mile K. Stojcev Stephen Brown Zvonko Vranesic, Fundamental of Digital Logic with Verilog Design, McGraw Hill, Boston, 2004, Hardcover, pp 844, plus XX, ISBN 0-07-121359-7. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:1, pp:194-195 [Journal]
Mile K. Stojcev John P. Hayes, Computer Architecture and Organization, Third ed., McGraw-Hill Book Company, Inc., Boston, 1988, Softcover, pp 604, plus XIV, ISBN 0-07-115997-5. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:1, pp:196-197 [Journal]
Mile K. Stojcev S. Sutherland, S. Davidman and P. Flake, System Verilog for Design: A Guide to Using System Verilog for Hardware Design and Modeling Hardcover, Kluwer Academic Publishers, Norwell, MA (2004) ISBN 1-4020-7530-8 pp 374, plus XXVIII, euro 119. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2006, v:46, n:1, pp:198-199 [Journal]
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