Journals in DBLP

Microelectronics Journal
2006, volume: 37, number: 10

1. M. Madani, H. Colder, X. Portier, K. Zellama, R. Rizk, H. Bouchriha
   Influence of hydrogen dilution and substrate temperature on growth of nanocrystalline hydrogenated silicon carbide films deposited by RF sputtering. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1031-1035 [Journal]
   
2. Cheng Luo, Fang Meng, Anand Francis
   Fabrication and application of silicon-reinforced PDMS masters. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1036-1046 [Journal]
   
3. Hyuck In Kwon, Umberto Ravaioli
   Simulation of electronic/ionic mixed conduction in solid ionic memory devices. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1047-1051 [Journal]
   
4. Xia Xiao, Xueyi You, Suying Yao
   Theoretical study of mechanical properties of multi-layer ULSI interconnect dielectrics by surface acoustic wave method. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1052-1055 [Journal]
   
5. Jonathan E. Greenspan
   A large-scale parametric study of InP deposition on patterned substrates. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1056-1063 [Journal]
   
6. Kah-Yoong Chan, Bee-San Teo
   Atomic force microscopy (AFM) and X-ray diffraction (XRD) investigations of copper thin films prepared by dc magnetron sputtering technique. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1064-1071 [Journal]
   
7. Giuseppe de Vita, Giuseppe Iannaccone
   Ultra-low-power temperature compensated voltage reference generator. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1072-1079 [Journal]
   
8. R. Al Asmar, J.-P. Atanas, Y. Zaatar, J. Podlecki, A. Foucaran
   Characterization and ellipsometric investigation of high-quality ZnO and ZnO(Ga₂O₃) thin alloys by reactive electron-beam co-evaporation technique. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1080-1085 [Journal]
   
9. Giuseppe Di Cataldo, Rosario Mita, Salvatore Pennisi
   High-speed CMOS unity-gain current amplifier. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2006, v:37, n:10, pp:1086-1091 [Journal]
   
10. Rosario Mita, Gaetano Palumbo, Pier Giorgio Fallica
    A fast driver circuit for single-photon sensors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1092-1096 [Journal]
    
11. Hassan Hassan, Mohab Anis, Mohamed I. Elmasry
    Low-power multi-threshold MCML: Analysis, design, and variability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1097-1104 [Journal]
    
12. Wen-Yaw Chung, Yeong-Tsair Lin, Dorota G. Pijanowska, Chung-Huang Yang, Ming-Chia Wang, Alfred Krzyskow, Wladyslaw Torbicz
    New ISFET interface circuit design with temperature compensation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1105-1114 [Journal]
    
13. Hariyadi Soetedjo, S. Ezrol Esham, Idris Sabtu, Y. Mohd Razman, A. M. Abdul Fatah
    Changes of electrical properties by Al content of Al_xGa_1-xAs in pHEMT structures as observed using HRXRD. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1115-1118 [Journal]
    
14. Francis Calmon, Cristian Andrei, Olivier Valorge, Jose-Cruz Nuñez Perez, Jacques Verdier, Christian Gontrand
    Impact of low-frequency substrate disturbances on a 4.5GHz VCO. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1119-1127 [Journal]
    
15. Davide Baderna, Alessandro Cabrini, Marco Pasotti, Guido Torelli
    Power efficiency evaluation in Dickson and voltage doubler charge pump topologies. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1128-1135 [Journal]
    
16. Kambiz K. Moez, Mohamed I. Elmasry
    Lumped-element analysis and design of CMOS distributed amplifiers with image impedance termination. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2006, v:37, n:10, pp:1136-1145 [Journal]