Journals in DBLP
Chao-Ming Lin , Win-Jin Chang , Te-Hua Fang Reliability analysis of the fine pitch connection using anisotropic conductive film (ACF). [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:565-568 [Journal ] Fei Zhang , Lina Shi , Wen Yu , Chengfang Li , Xiaowei Sun Novel buffer engineering: A concept for fast switching and low loss operation of planar IGBT. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:569-573 [Journal ] Wanjun Chen , Bo Zhang , Zhaoji Li A novel double RESURF LDMOS and a versatile JFET device used as internal power supply and current detector for SPIC. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:574-578 [Journal ] Hasina F. Huq , Syed K. Islam AlGaN/GaN self-aligned MODFET with metal oxide gate for millimeter wave application. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:579-582 [Journal ] Junxue Ran , Xiaoliang Wang , Guoxin Hu , Junxi Wang , Jianping Li , Cuimei Wang , Yiping Zeng , Jinmin Li Study on Mg memory effect in npn type AlGaN/GaN HBT structures grown by MOCVD. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:583-585 [Journal ] L. Bouzrara , R. Ajjel , H. Mejri , M. A. Zaïdi , Hichem Maaref Alloy splitting of Te-DX in Alx Ga1-x As analysis using the deep level transient spectroscopy technique. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:586-590 [Journal ] Stephan Kronholz , Silvia Karthäuser , A. van der Hart , T. Wandlowski , Rainer Waser Metallic nanogaps with access windows for liquid based systems. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:591-594 [Journal ] Yuan Tian , Hong Wang Temperature dependence of DC characteristics of NpN InP/GaAsSb/InP double heterojunction bipolar transistors: an analytical study. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:595-600 [Journal ] Milene Galeti , Marcelo Antonio Pavanello , João Antonio Martino Evaluation of graded-channel SOI MOSFET operation at high temperatures. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:601-607 [Journal ] Kah-Yoong Chan , Teck-Yong Tou , Bee-San Teo Thickness dependence of the structural and electrical properties of copper films deposited by dc magnetron sputtering technique. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:608-612 [Journal ] Weida Hu , Xiaoshuang Chen , Xuchang Zhou , Zhijue Quan , Lu Wei Quantum-mechanical effects and gate leakage current of nanoscale n-type FinFETs: A 2d simulation study. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:613-619 [Journal ] Sneha Kabra , Harsupreet Kaur , Ritesh Gupta , Subhasis Haldar , Mridula Gupta , R. S. Gupta A semi empirical approach for submicron GaN MESFET using an accurate velocity field relationship for high power applications. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:620-626 [Journal ] Giuseppe de Vita , F. Bellatalla , Giuseppe Iannaccone Ultra-low power PSK backscatter modulator for UHF and microwave RFID transponders. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:627-629 [Journal ] Jean-François Eloy , Michel Depeyrot Nanometer range: A new theoretical challenge for microelectronics and optoelectronics. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:630-634 [Journal ] A. Benfdila , F. Balestra On the drain current saturation in short channel MOSFETs. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:635-641 [Journal ] R. Kinder , A. Vincze , M. Kuruc , R. Srnánek , B. Lojek , B. Sopko , D. Chren Investigation of the implanted phosphorus in a boron doped SiGe epitaxial layer. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:642-645 [Journal ] Emmanuel M. Drakakis Systematic derivation of explicit design formulae for log-domain: A 3rd-order lowpass example. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:646-656 [Journal ] Clóves G. Rodrigues Electron mobility in n-doped zinc sulphide. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:657-660 [Journal ] Zhilin Sun , Weifeng Sun , Longxing Shi A review of safe operation area. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2006, v:37, n:7, pp:661-667 [Journal ]