Journals in DBLP

Microelectronics Journal
2005, volume: 36, number: 8

1. J. W. Wan, W. J. Zhang, D. J. Bergstrom
   Influence of transient flow and solder bump resistance on underfill process. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:687-693 [Journal]
   
2. R. Al Asmar, G. Ferblantier, J. L. Sauvajol, A. Giani, A. Khoury, A. Foucaran
   Fabrication and characterisation of high quality ZnO thin films by reactive electron beam evaporation technique. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:694-699 [Journal]
   
3. Adam Augustin, Bartosz Maj, Arno Kostka
   A structure oriented compact thermal model for multiple heat source ASICs. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:700-704 [Journal]
   
4. M. A. Mastro, J. R. LaRoche, N. D. Bassim, C. R. Eddy
   Simulation on the effect of non-uniform strain from the passivation layer on AlGaN/GaN HEMT. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:705-711 [Journal]
   
5. Han-Chang Tsai
   Investigation of electromagnetic radiation induced by conducting wire of nanometer multi-quantum well device on InGaN LED. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:712-717 [Journal]
   
6. N. G. Shankar, Z. W. Zhong
   A new rule-based clustering technique for defect analysis. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:718-724 [Journal]
   
7. C. B. Samantaray, Hyunjun Sim, Hyunsang Hwang
   The electronic structures and optical properties of BaTiO₃ and SrTiO₃ using first-principles calculations. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:725-728 [Journal]
   
8. T. K. H. Starke, P. Igic
   Feedback supported isolation structure for blocking of minority leakage carriers in power integrated circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:729-731 [Journal]
   
9. M. Alvaro, A. Caddemi, G. Crupi, N. Donato
   Temperature and bias investigation of self heating effect and threshold voltage shift in pHEMT's. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2005, v:36, n:8, pp:732-736 [Journal]
   
10. Xi-Ning Wang, Xiao-Lin Zhao, Yong Zhou, Xu-Han Dai, Bing-Chu Cai
    Fabrication and performance of novel RF spiral inductors on silicon. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:737-740 [Journal]
    
11. Fengming Zhang, Rui Tang, Yong-Bin Kim
    SET-based nano-circuit simulation and design method using HSPICE. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:741-748 [Journal]
    
12. Grace Wang, S. Balakumar, S. C. Hwee, Rakesh Kumar, T. Hara
    Enhancement of adhesion strength of Cu layer with low dielectric constant SiC: H liners in Cu interconnects. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:749-753 [Journal]
    
13. C. Psychalinos
    Switched-current (SI) integrators with reduced effect of transistor mismatches. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:754-762 [Journal]
    
14. E. Hernández, R. Berenguer, J. Legarda, J. Mendizabal, I. Cendoya
    An integrated up-converter circuit in 0.8mum SiGe technology for TV applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:763-769 [Journal]
    
15. Jee-Youl Ryu, Bruce C. Kim
    Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:770-777 [Journal]
    
16. H. Rodríguez-Coppola, F. García-Moliner, Joaquín Tutor-Sánchez
    Polarisability of a confined multisubband electron gas with exchange and correlation interactions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:8, pp:778-785 [Journal]