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Journals in DBLP

Microelectronics Journal
2005, volume: 36, number: 12

  1. Bozena Kaminska, Stephen K. Sunter, Salvador Mir
    Analog and mixed signal test techniques for SOC development. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1063- [Journal]
  2. R. Mozuelos, Y. Lechuga, Mar Martínez, Salvador Bracho
    Test of a switched-capacitor ADC by a built-in charge sensor. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1064-1072 [Journal]
  3. Eduardo Romero, Gabriela Peretti, Gloria Huertas, Diego Vázquez
    Test of switched-capacitor ladder filters using OBT. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1073-1079 [Journal]
  4. Guillaume Prenat, Salvador Mir, Diego Vázquez, Luís Rolíndez
    A low-cost digital frequency testing approach for mixed-signal devices using SigmaDelta modulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1080-1090 [Journal]
  5. Anand Gopalan, Martin Margala, P. R. Mukund
    A current based self-test methodology for RF front-end circuits. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1091-1102 [Journal]
  6. Hans G. Kerkhoff
    The test search for true mixed-signal cores. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1103-1111 [Journal]
  7. Antonio Andrade Jr., Gustavo Vieira, Tiago R. Balen, Marcelo Lubaszewski, Florence Azaïs, Michel Renovell
    Built-in self-test of global interconnects of field programmable analog arrays. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2005, v:36, n:12, pp:1112-1123 [Journal]
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