Journals in DBLP
Vladimir Székely Special issue on thermal investigations of integrated circuits and systems (THERMINIC'03). [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:789-790 [Journal ] James Christofferson , Ali Shakouri Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:791-796 [Journal ] Luis David Patiño Lopez , Stéphane Grauby , Stefan Dilhaire , M. Amine Salhi , Wilfrid Claeys , Stéphane Lefèvre , Sebastian Volz Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:797-803 [Journal ] Stefan Holzer , Rainer Minixhofer , Clemens Heitzinger , Johannes Fellner , Tibor Grasser , Siegfried Selberherr Extraction of material parameters based on inverse modeling of three-dimensional interconnect fusing structures. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:805-810 [Journal ] Stefan Dilhaire , Stéphane Grauby , Wilfrid Claeys , Jean-Christophe Batsale Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:811-816 [Journal ] Qinglin Song , Zheng Cui , Shanhong Xia , Shaofeng Chen An ac microcalorimeter for measuring specific heat of thin films. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:817-821 [Journal ] N. J. Pilgrim , W. Batty , R. W. Kelsall , Christopher M. Snowden Nanoscale electrothermal co-simulation: compact dynamic models of hyperbolic heat transport and self-consistent device Monte Carlo. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:823-830 [Journal ] Marcin Janicki , Marcin Daniel , Michal Szermer , Andrzej Napieralski Ion sensitive field effect transistor modelling for multidomain simulation purposes. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:831-840 [Journal ] X. Perpiñà , X. Jordà , N. Mestres , M. Vellvehí , Ph. Godignon , J. Millán Self-heating experimental study of 600V PT-IGBTs under low dissipation energies. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:841-847 [Journal ] Mariagrazia Graziano , Mario R. Casu , Guido Masera , Gianluca Piccinini , Maurizio Zamboni Effects of temperature in deep-submicron global interconnect optimization in future technology nodes. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:849-857 [Journal ] Lorenzo Codecasa Electro-thermal chaotic oscillations of paralleled bipolar transistors. [Citation Graph (0, 0)][DBLP ] Microelectronics Journal, 2004, v:35, n:10, pp:859-868 [Journal ]