Journals in DBLP

Microelectronics Journal
2004, volume: 35, number: 6

1. Etienne Sicard
   Electromagnetic compatibility of integrated circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:485-486 [Journal]
   
2. Ross M. Carlton
   An overview of standards in electromagnetic compatibility for integrated circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:487-495 [Journal]
   
3. Bob Ross
   IBIS and ICEM interaction. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:497-500 [Journal]
   
4. Jean-Luc Levant, Mohammed Ramdani, Richard Perdriau
   ICEM modelling of microcontroller current activity. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:501-507 [Journal]
   
5. C. Lochot, S. Calvet, S. Ben Dhia, Etienne Sicard
   REGINA test mask: research on EMC guidelines for integrated automotive circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:509-523 [Journal]
   
6. Timm Ostermann
   Influence of the power supply on the radiated electromagnetic emission of integrated circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:525-530 [Journal]
   
7. Dhanistha Panyasak, Gilles Sicard, Marc Renaudin
   A current shaping methodology for lowering em disturbances in asynchronous circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:531-540 [Journal]
   
8. Richard Perdriau, Mohammed Ramdani, Jean-Luc Levant, Eric Tinlot, Anne-Marie Trullemans-Anckaert
   An EMC-oriented VHDL-AMS simulation methodology for dynamic current activity assessment. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:541-546 [Journal]
   
9. T. Steinecke, H. Koehne, M. Schmidt
   Behavioral EMI models of complex digital VLSI circuits. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2004, v:35, n:6, pp:547-555 [Journal]
   
10. F. Fiori, P. S. Crovetti
    Investigation on RFI effects in bandgap voltage references. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2004, v:35, n:6, pp:557-561 [Journal]
    
11. Olivier Maurice, François de Daran, Frédéric Lafon, Rabha Oussedrat, Imad Ben Yacoub
    GTEM cell facility use during project development phases for automotive. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2004, v:35, n:6, pp:563-569 [Journal]