Journals in DBLP

IEEE Transactions on Reliability
2005, volume: 54, number: 1

1. Suprasad V. Amari
   Comment on: a hazard function approximation used in reliability theory. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:2- [Journal]
   
2. Zehua Chen, Shurong Zheng
   Lifetime distribution based degradation analysis. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:3-10 [Journal]
   
3. H. Hirose
   The trunsored model and its applications to lifetime analysis: unified censored and truncated models. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:11-21 [Journal]
   
4. Sangun Park
   Testing exponentiality based on the Kullback-Leibler information with the type II censored data. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:22-26 [Journal]
   
5. N. Balakrishnan, C.-T. Lin, Ping-Shing Chan
   A comparison of two simple prediction intervals for exponential distribution. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:27-33 [Journal]
   
6. A. A. Soliman
   Estimation of parameters of life from progressively censored data using Burr-XII model. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:34-42 [Journal]
   
7. Francis G. Pascual, Grace Montepiedra
   Lognormal and Weibull accelerated life test plans under distribution misspecification. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:43-52 [Journal]
   
8. Guangbin Yang
   Accelerated life tests at higher usage rates. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:53-57 [Journal]
   
9. Loon Ching Tang, Kai Xu
   A multiple objective framework for planning accelerated life tests. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2005, v:54, n:1, pp:58-63 [Journal]
   
10. A. A. Alhadeed, Shie-Shien Yang
    Optimal simple step-stress plan for cumulative exposure model using log-normal distribution. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:64-68 [Journal]
    
11. Ioannis Voyiatzis, Antonis M. Paschalis, Dimitris Gizopoulos, Nektarios Kranitis, Constantin Halatsis
    A concurrent built-in self-test architecture based on a self-testing RAM. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:69-78 [Journal]
    
12. Y. Saito, T. Hashinaga, S. Nakajima
    Effect of CVD-SiO₂ film on reliability of GaAs MESFET with Ti/Pt/Au gate metal. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:79-82 [Journal]
    
13. Zhimin He, Han Tong Loh, Eng Hong Ong
    A probabilistic approach to evaluate the reliability of piezoelectric micro-actuators. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:83-91 [Journal]
    
14. Ruey Huei Yeh, Gaung-Cheng Chen, Ming-Yuh Chen
    Optimal age-replacement policy for nonrepairable products under renewing free-replacement warranty. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:92-97 [Journal]
    
15. Winfrid G. Schneeweiss
    Toward a deeper understanding of the availability of series-systems without aging during repairs. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:98-99 [Journal]
    
16. Yuan-Shun Dai, Min Xie, Kim-Leng Poh
    Modeling and analysis of correlated software failures of multiple types. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:100-106 [Journal]
    
17. Daniel R. Jeske, Xuemei Zhang, Loan Pham
    Adjusting software failure rates that are estimated from test data. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:107-114 [Journal]
    
18. I.-R. Chen, Baoshan Gu, S. E. George, Sheng-Tzong Cheng
    On failure recoverability of client-server applications in mobile wireless environments. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:115-122 [Journal]
    
19. Kyu-Seek Sohn, Seung Yeob Nam, D. K. Sung
    A spare bandwidth sharing scheme based on network reliability. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:123-132 [Journal]
    
20. Sieteng Soh, Suresh Rai
    An efficient cutset approach for evaluating communication-network reliability with heterogeneous link-capacities. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:133-144 [Journal]
    
21. Hosam M. F. AboElFotoh, S. S. Iyengar, K. Chakrabarty
    Computing reliability and message delay for Cooperative wireless distributed sensor networks subject to random failures. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:145-155 [Journal]
    
22. Antoine Rauzy
    A m log m algorithm to compute the most probable configurations of a system with multi-mode independent components. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:156-158 [Journal]
    
23. Jian-Ping Li, G. Thompson
    A method to take account of inhomogeneity in mechanical component reliability calculations. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:159-168 [Journal]
    
24. F. K. Hwang
    A hierarchy of importance indices. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:169-172 [Journal]
    
25. K. Jenab, B. S. Dhillon
    Stochastic fault tree analysis with self-loop basic events. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:173-180 [Journal]
    
26. M. V. Frank
    View through the door of the SOFIA project. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2005, v:54, n:1, pp:181-188 [Journal]