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Journals in DBLP

IEEE Transactions on Reliability
2006, volume: 55, number: 2

  1. Yue Song, Hai-lin Feng, San-yang Liu
    Reliability models of a bridge system structure under incomplete information. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:162-168 [Journal]
  2. Jianfang Zhang
    The calculating formulae, and experimental methods in error propagation analysis. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:169-181 [Journal]
  3. Zhihua Zheng, Lirong Cui, A. G. Hawkes
    A study on a single-unit Markov repairable system with repair time omission. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:182-188 [Journal]
  4. Ji Hwan Cha
    An extended model for optimal burn-in procedures. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:189-198 [Journal]
  5. S. Satitsatian, K. C. Kapur
    An algorithm for lower reliability bounds of multistate two-terminal networks. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:199-206 [Journal]
  6. J. A. Carrasco
    Failure Transition Distance-Based Importance Sampling Schemes for theSimulation of Repairable Fault-Tolerant Computer Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:207-236 [Journal]
  7. A. M. Mathai, S. B. Provost
    On q-logistic and related models. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:237-244 [Journal]
  8. Mark Bebbington, Chin-Diew Lai, Ricardas Zitikis
    Useful periods for lifetime distributions with bathtub shaped hazard rate functions. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:245-251 [Journal]
  9. M. Hayashi, T. Abe, I. Nakajima
    Transformation from availability expression to failure frequency expression. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:252-261 [Journal]
  10. D. Kundu, A. M. Sarhan
    Analysis of incomplete data in presence of competing risks among several groups. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:262-269 [Journal]
  11. D. Kundu, R. D. Gupta
    Estimation of P[Y<X] for Weibull distributions. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:270-280 [Journal]
  12. Swapna S. Gokhale, Michael R. Lyu, Kishor S. Trivedi
    Incorporating fault debugging activities into software reliability models: a simulation approach. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:281-292 [Journal]
  13. Shyue-Kung Lu, Chih-Hsien Hsu
    Fault tolerance techniques for high capacity RAM. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:293-306 [Journal]
  14. K. O. Kim
    Relating integrated circuit yield and time-dependent reliability for various defect density distributions. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:307-313 [Journal]
  15. M. Asadi, I. Bayramoglu
    The mean residual life function of a k-out-of-n structure at the system level. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:314-318 [Journal]
  16. M. J. Zuo, Zhigang Tian
    Performance evaluation of generalized multi-state k-out-of-n systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:319-327 [Journal]
  17. Shwu-Tzy Jiang, T. L. Landers, T. R. Rhoads
    Assessment of repairable-system reliability using proportional intensity models: a review. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:328-336 [Journal]
  18. Yuan-Shun Dai, Gregory Levitin
    Reliability and performance of tree-structured grid services. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:337-349 [Journal]
  19. Zhihua Tang, Joanne Bechta Dugan
    BDD-based reliability analysis of phased-mission systems with multimode failures. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:350-360 [Journal]
  20. Xiang Zhang, E. Gockenbach
    Assessment of the actual condition of the electrical components in medium-voltage networks. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:361-368 [Journal]
  21. Hung-Yau Lin, Fu-Min Yeh, Sy-Ysen. Kuo
    An efficient algorithm for spare allocation problems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:369-378 [Journal]
  22. C. Park, W. J. Padgett
    Stochastic degradation models with several accelerating variables. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:379-390 [Journal]
  23. M. Walter, Winfrid G. Schneeweiss
    Review of "The Modeling World of Reliability/Safety Engineering". [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:391- [Journal]
  24. Winfrid G. Schneeweiss
    "Review of Petri Net Picture Book" and "Petri Nets for Reliability Modeling". [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:2, pp:391-392 [Journal]
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