Journals in DBLP

IEEE Transactions on Reliability
2006, volume: 55, number: 1

1. Wenbiao Zhao, Rong Pan, A. Aron, A. Mettas
   Some properties of confidence bounds on reliability estimation for parts under varying stresses. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:7-17 [Journal]
   
2. P. Hokstad, A. Maria, P. Tomis
   Estimation of common cause factors from systems with different numbers of channels. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:18-25 [Journal]
   
3. J. E. Ramirez-Marquez, Wei Jiang
   On improved confidence bounds for system reliability. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:26-36 [Journal]
   
4. Chunghun Ha, Way Kuo
   Multi-path heuristic for redundancy allocation: the tree heuristic. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:37-43 [Journal]
   
5. J. F. Shortle, M. B. Mendel
   A generalized framework for probabilistic design with application to rotors. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:44-52 [Journal]
   
6. Chi-Hyuck Jun, S. Balamurali, Sang-Ho Lee
   Variables sampling plans for Weibull distributed lifetimes under sudden death testing. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:53-58 [Journal]
   
7. Chen-Mao Liao, Sheng-Tsaing Tseng
   Optimal design for step-stress accelerated degradation tests. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:59-66 [Journal]
   
8. Chengjie Xiong, Kejun Zhu, Ming Ji
   Analysis of a simple step-stress life test with a random stress-change time. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:67-74 [Journal]
   
9. P. Sadegh, A. Thompson, Xiaodong Luo, Young Park, T. Sienel
   A methodology for predicting service life and design of reliability experiments. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2006, v:55, n:1, pp:75-85 [Journal]
   
10. H. Boudali, Joanne Bechta Dugan
    A continuous-time Bayesian network reliability modeling, and analysis framework. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:86-97 [Journal]
    
11. H. Yamamoto, M. J. Zuo, T. Akiba, Zhigang Tian
    Recursive formulas for the reliability of multi-state consecutive-k-out-of-n: G systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:98-104 [Journal]
    
12. Chin Ching Chiu, Chung-Hsien Hsu, Yi-Shiung Yeh
    A genetic algorithm for reliability-oriented task assignment with k/spl tilde/ duplications in distributed systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:105-117 [Journal]
    
13. Guan Jun Wang, Yuan Lin Zhang
    Optimal periodic preventive repair and replacement policy assuming geometric process repair. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:118-122 [Journal]
    
14. Yong Chen, Jionghua Jin
    Quality-oriented-maintenance for multiple interactive tooling components in discrete manufacturing processes. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:123-134 [Journal]
    
15. T. T. John, P. Chen
    Lognormal selection with applications to lifetime data. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:135-148 [Journal]
    
16. V. R. Joseph, I-Tang Yu
    Reliability improvement experiments with degradation data. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2006, v:55, n:1, pp:149-157 [Journal]