A. N. Das, D. Acharya Age replacement of components during IFR delay time. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:3, pp:306-312 [Journal]

N. Balakrishnan, H. K. T. Ng, N. Kannan Goodness-of-fit tests based on spacings for progressively type-II censored data from a general location-scale distribution. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:3, pp:349-356 [Journal]

B. Senoglu, B. Surucu Goodness-of-fit tests based on Kullback-Leibler information. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:3, pp:357-361 [Journal]

Yi-Kuei Lin Reliability of a stochastic-flow network with unreliable branches & nodes, under budget constraints. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:3, pp:381-387 [Journal]

Yun-Chia Liang, Alice E. Smith An ant colony optimization algorithm for the redundancy allocation problem (RAP). [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:3, pp:417-423 [Journal]

Shey-Huei Sheu, Yu-Hung Chien Minimizing cost-functions related to both burn-in and field-operation under a generalized model. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:3, pp:435-439 [Journal]