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Journals in DBLP

IEEE Transactions on Reliability
2004, volume: 53, number: 3

  1. L. Gonzalez, D. Garcia, B. Galvan
    An intrinsic order criterion to evaluate large, complex fault trees. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:297-305 [Journal]
  2. A. N. Das, D. Acharya
    Age replacement of components during IFR delay time. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:306-312 [Journal]
  3. R. Romera, José E. Valdés, Rómulo I. Zequeira
    Active-redundancy allocation in systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:313-318 [Journal]
  4. G. Latif-Shabgahi, Julian M. Bass, Stuart Bennett
    A taxonomy for software voting algorithms used in safety-critical systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:319-328 [Journal]
  5. S. C. Cheung, Samuel T. Chanson, Zhendong Xu
    Applying generic timing tests for distributed multimedia software systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:329-341 [Journal]
  6. Michele Favalli, Cecilia Metra
    TMR voting in the presence of crosstalk faults at the voter inputs. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:342-348 [Journal]
  7. N. Balakrishnan, H. K. T. Ng, N. Kannan
    Goodness-of-fit tests based on spacings for progressively type-II censored data from a general location-scale distribution. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:349-356 [Journal]
  8. B. Senoglu, B. Surucu
    Goodness-of-fit tests based on Kullback-Leibler information. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:357-361 [Journal]
  9. Jinsheng Huang, M. J. Zuo
    Dominant multi-state systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:362-368 [Journal]
  10. David W. Coit, Tongdan Jin, N. Wattanapongsakorn
    System optimization with component reliability estimation uncertainty: a multi-criteria approach. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:369-380 [Journal]
  11. Yi-Kuei Lin
    Reliability of a stochastic-flow network with unreliable branches & nodes, under budget constraints. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:381-387 [Journal]
  12. E. Gouno, A. Sen, N. Balakrishnan
    Optimal step-stress test under progressive type-I censoring. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:388-393 [Journal]
  13. G. Levitin
    Consecutive k-out-of-r-from-n system with multiple failure criteria. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:394-400 [Journal]
  14. Nozer D. Singpurwalla, Chung-Wai Kong
    Specifying interdependence in networked systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:401-405 [Journal]
  15. N. Wattanapongsakorn, S. P. Levitan
    Reliability optimization models for embedded systems with multiple applications. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:406-416 [Journal]
  16. Yun-Chia Liang, Alice E. Smith
    An ant colony optimization algorithm for the redundancy allocation problem (RAP). [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:417-423 [Journal]
  17. Marzio Marseguerra, Enrico Zio, L. Podofillini
    Optimal reliability/availability of uncertain systems via multi-objective genetic algorithms. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:424-434 [Journal]
  18. Shey-Huei Sheu, Yu-Hung Chien
    Minimizing cost-functions related to both burn-in and field-operation under a generalized model. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:435-439 [Journal]
  19. G.-A. Klutke, Peter C. Kiessler, M. A. Wortman
    Erratum. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:440- [Journal]

  20. Erratum. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2004, v:53, n:3, pp:440- [Journal]
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