W. A. Marsh Opinion item: cancelled US-military specifications. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:1-2 [Journal]
Min-Sheng Lin An O(k2·log(n)) algorithm for computing the reliability of consecutive-k-out-of-n: F systems. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:3-6 [Journal]
C. Park, K. B. Kulasekera Parametric inference of incomplete data with competing risks among several groups. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:11-21 [Journal]
Chengjie Xiong, Ming Ji Analysis of grouped and censored data from step-stress life test. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:22-28 [Journal]
U. Balasooriya, C.-K. Low Competing causes of failure and reliability tests for Weibull lifetimes under type I progressive censoring. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:29-36 [Journal]
Jun Bai, Hoang Pham Discounted warranty cost of minimally repaired series systems. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:37-42 [Journal]
Wei Huang, Ronald G. Askin A generalized SSI reliability model considering stochastic loading and strength aging degradation. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:77-82 [Journal]
E. L. Meyer, E. E. van Dyk Assessing the reliability and degradation of photovoltaic module performance parameters. [Citation Graph (0, 0)][DBLP] IEEE Transactions on Reliability, 2004, v:53, n:1, pp:83-92 [Journal]