Journals in DBLP

IEEE Transactions on Reliability
2003, volume: 52, number: 1

1. R. A. Evans
   Editorial reasonable engineering guess. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:1- [Journal]
   
2. R. A. Evans
   Editorial genuine imitation Bayesian. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:2- [Journal]
   
3. R. A. Evans
   Editorial confidence intervals for discrete variables. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:3- [Journal]
   
4. Xu Haiyan, Tang Yincai
   Commentary: the Khamis/Higgins model. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:4-6 [Journal]
   
5. R. A. Betensky, E. C. Martin
   Commentary: failure-rate functions for doubly-truncated random variables. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:7-8 [Journal]
   
6. A. Birolini
   Commentary: author reply to a book review. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:9- [Journal]
   
7. J. A. Connor
   Commentary: getting real about reliability, through wit and humor. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:10-13 [Journal]
   
8. Shaomin Wu, Ling-Yau Chan
   Performance utility-analysis of multi-state systems. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:14-21 [Journal]
   
9. Li Sheng, Jie Wu
   Maximum-shortest-path (MSP) is not optimal for a general N×N torus. [Citation Graph (0, 0)][DBLP]
   IEEE Transactions on Reliability, 2003, v:52, n:1, pp:22-25 [Journal]
   
10. S. Gasmi, C. E. Love, W. Kahle
    A general repair, proportional-hazards, framework to model complex repairable systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:26-32 [Journal]
    
11. C. D. Lai, Min Xie, D. N. P. Murthy
    A modified Weibull distribution. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:33-37 [Journal]
    
12. Jie Mi
    A unified way of comparing the reliability of coherent systems. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:38-43 [Journal]
    
13. M. Lanus, Liang Yin, Kishor S. Trivedi
    Hierarchical composition and aggregation of state-based availability and performability models. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:44-52 [Journal]
    
14. C. Constantinescu
    Experimental evaluation of error-detection mechanisms. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:53-57 [Journal]
    
15. Nader B. Ebrahimi
    Indirect assessment of system reliability. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:58-62 [Journal]
    
16. M. G. F. Bell
    The use of game theory to measure the vulnerability of stochastic networks. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:63-68 [Journal]
    
17. O. Gaudoin, Bo Yang, Min Xie
    A simple goodness-of-fit test for the power-law process, based on the Duane plot. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:69-74 [Journal]
    
18. Nong Ye, Sean Vilbert, Qiang Chen
    Computer intrusion detection through EWMA for autocorrelated and uncorrelated data. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:75-82 [Journal]
    
19. Yeh Lam, Yuan Lin Zhang
    A geometric-process maintenance model for a deteriorating system under a random environment. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:83-89 [Journal]
    
20. N. Balakrishnan, N. Kannan, C. T. Lin, H. K. T. Ng
    Point and interval estimation for Gaussian distribution, based on progressively Type-II censored samples. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:90-95 [Journal]
    
21. Antoine Rauzy
    A new methodology to handle Boolean models with loops. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:96-105 [Journal]
    
22. A. O. C. Elegbede, Chengbin Chu, Kondo H. Adjallah, F. Yalaoui
    Reliability allocation through cost minimization. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:106-111 [Journal]
    
23. A. Brezavscek, A. Hudoklin
    Joint optimization of block-replacement and periodic-review spare-provisioning policy. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:112-117 [Journal]
    
24. T. R. Bennett, J. M. Booker, Sallie Keller-McNulty, Nozer D. Singpurwalla
    Testing the untestable: reliability in the 21st century. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:118-124 [Journal]
    
25. G.-A. Klutke, Peter C. Kiessler, M. A. Wortman
    A critical look at the bathtub curve. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:125-129 [Journal]
    
26. T. E. Salzer
    Tubulation techniques for locating fine-leak sites in hermetic electronic packages. [Citation Graph (0, 0)][DBLP]
    IEEE Transactions on Reliability, 2003, v:52, n:1, pp:130-132 [Journal]