Journals in DBLP

Microelectronics Journal
2003, volume: 34, number: 1

1. Régis Leveugle, Glenn H. Chapman
   Special section on defect and fault tolerance in VLSI systems. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:1- [Journal]
   
2. Farzin Karimi, V. Swamy Irrinki, T. Crosby, Nohpill Park, Fabrizio Lombardi
   Parallel testing of multi-port static random access memories. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:3-21 [Journal]
   
3. Cecilia Metra, Stefano Di Francescantonio, Michele Favalli, Bruno Riccò
   Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:23-29 [Journal]
   
4. Kaijie Wu, Piyush Mishra, Ramesh Karri
   Concurrent error detection of fault-based side-channel cryptanalysis of 128-bit RC6 block cipher. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:31-39 [Journal]
   
5. Daniel Gil, J. Gracia, J. C. Baraza, Pedro J. Gil
   Study, comparison and application of different VHDL-based fault injection techniques for the experimental validation of a fault-tolerant system. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:41-51 [Journal]
   
6. Pierluigi Civera, Luca Macchiarulo, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
   New techniques for efficiently assessing reliability of SOCs. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:53-61 [Journal]
   
7. Kwang-Su Lee, Toh-Ming Lu, X.-C. Zhang
   The measurement of the dielectric and optical properties of nano thin films by THz differential time-domain spectroscopy. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:63-69 [Journal]
   
8. H. G. Yang, Y. Shi, L. Pu, S. L. Gu, B. Shen, P. Han, R. Zhang, Y. D. Zhang
   Numerical investigation of characteristics of p-channel Ge/Si hetero-nanocrystal memory. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:71-75 [Journal]
   
9. N. Kaushik, A. Kranti, Mridula Gupta, R. S. Gupta
   Extraction technique for characterization of electric field distribution and drain current in VDMOS power transistor. [Citation Graph (0, 0)][DBLP]
   Microelectronics Journal, 2003, v:34, n:1, pp:77-83 [Journal]
   
10. Feng Huang, Xubang Shen, Xuecheng Zou, Chaoyang Chen
    Analog signal generator for BIST of wideband IF signals bandpass sigma-delta modulator. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:1, pp:85-91 [Journal]
    
11. Mile K. Stojcev
    Data structures with C++ using STL, 2/e: William Ford, William Top (Eds.); Prentice Hall, Upper Saddle River, NJ, 2002, 1037 pages, hardcover, ISBN 0-13-085850-1, plus XXVI. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:1, pp:93-94 [Journal]