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Journals in DBLP

J. Electronic Testing
2005, volume: 21, number: 4

  1. D. Barros Júnior, M. Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, J. P. Teixeira
    Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:349-363 [Journal]
  2. Abdelaziz Ammari, K. Hadjiat, Régis Leveugle
    Combined Fault Classification and Error Propagation Analysis to Refine RT-Level Dependability Evaluation. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:365-376 [Journal]
  3. José Manuel Cazeaux, Daniele Rossi, Cecilia Metra
    Self-Checking Voter for High Speed TMR Systems. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:377-389 [Journal]
  4. Steffen Tarnick
    Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:391-404 [Journal]
  5. Carl Jeffrey, Reuben Cutajar, Andrew Richardson, Stephen Prosser, M. Lickess, Stephen Riches
    The Integration of On-Line Monitoring and Reconfiguration Functions into a Safety Critical Automotive Electronic Control Unit. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:405-416 [Journal]
  6. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Low Cost On-Line Testing Strategy for RF Circuits. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:417-427 [Journal]
  7. Gian-Carlo Cardarilli, Fabrizio Lombardi, Marco Ottavi, Salvatore Pontarelli, Marco Re, Adelio Salsano
    A Comparative Evaluation of Designs for Reliable Memory Systems. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:429-444 [Journal]
  8. Michael Nicolaidis, Lorena Anghel, Nadir Achouri
    Memory Defect Tolerance Architectures for Nanotechnologies. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:445-455 [Journal]
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