Journals in DBLP

J. Electronic Testing
2006, volume: 22, number: 1

1. Vishwani D. Agrawal
   Editorial. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:5- [Journal]
   
2. Bashir M. Al-Hashimi, Dimitris Gizopoulos, Manoj Sachdev, Adit D. Singh
   New JETTA Editors, 2006. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:9-10 [Journal]
   
3. Ali Chehab, Saurabh Patel, Rafic Z. Makki
   Scaling of i_DDT Test Methods for Random Logic Circuits. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:11-22 [Journal]
   
4. Audhild Vaaje
   Theorems for Fault Collapsing in Combinational Circuits. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:23-36 [Journal]
   
5. Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang
   An Efficient Dictionary Organization for Maximum Diagnosis. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:37-48 [Journal]
   
6. Zhen Shi, Peter Sandborn
   Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:49-60 [Journal]
   
7. Piet Engelke, Ilia Polian, Michel Renovell, Bernd Becker
   Automatic Test Pattern Generation for Resistive Bridging Faults. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:61-69 [Journal]
   
8. Hani Rizk, Christos A. Papachristou, Francis G. Wolff
   A Self Test Program Design Technique for Embedded DSP Cores. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:71-87 [Journal]
   
9. Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel
   A Gated Clock Scheme for Low Power Testing of Logic Cores. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2006, v:22, n:1, pp:89-99 [Journal]
   
10. Vitalij Ocheretnij, Michael Gössel, Egor S. Sogomonyan, Daniel Marienfeld
    Modulo p=3 Checking for a Carry Select Adder. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:1, pp:101-107 [Journal]