Journals in DBLP

J. Electronic Testing
2007, volume: 23, number: 2-3

1. Vishwani D. Agrawal
   Editorial. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:111- [Journal]
   
2. Bruce Kim
   Test Technology Newsletter April 2007. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:113-114 [Journal]
   
3. Mohammad Tehranipoor
   Guest Editorial. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:115-116 [Journal]
   
4. Tad Hogg, Greg Snider
   Defect-tolerant Logic with Nanoscale Crossbar Circuits. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:117-129 [Journal]
   
5. Jason G. Brown, R. D. (Shawn) Blanton
   A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:131-144 [Journal]
   
6. Zhanglei Wang, Krishnendu Chakrabarty
   Built-in Self-test and Defect Tolerance in Molecular Electronics-based Nanofabrics. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:145-161 [Journal]
   
7. Jing Huang, Mariam Momenzadeh, Fabrizio Lombardi
   On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:163-174 [Journal]
   
8. Jia Di, Parag K. Lala
   Cellular Array-based Delay-insensitive Asynchronous Circuits Design and Test for Nanocomputing Systems. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:175-192 [Journal]
   
9. Sanjukta Bhanja, Marco Ottavi, Fabrizio Lombardi, Salvatore Pontarelli
   QCA Circuits for Robust Coplanar Crossing. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:2-3, pp:193-210 [Journal]
   
10. Mo Liu, Craig S. Lent
    Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:2-3, pp:211-218 [Journal]
    
11. Fei Su, William L. Hwang, Arindam Mukherjee, Krishnendu Chakrabarty
    Testing and Diagnosis of Realistic Defects in Digital Microfluidic Biochips. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:2-3, pp:219-233 [Journal]
    
12. Wenjing Rao, Alex Orailoglu, Ramesh Karri
    Towards Nanoelectronics Processor Architectures. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:2-3, pp:235-254 [Journal]
    
13. Kundan Nepal, R. Iris Bahar, Joseph L. Mundy, William R. Patterson, Alexander Zaslavsky
    Designing Nanoscale Logic Circuits Based on Markov Random Fields. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:2-3, pp:255-266 [Journal]