Journals in DBLP

J. Electronic Testing
2007, volume: 23, number: 4

1. Erik Schüler, Marcelo Ienczczak Erigson, Luigi Carro
   Functionally Fault-tolerant DSP Microprocessor using Sigma-delta Modulated Signals. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:275-292 [Journal]
   
2. J. M. Gilbert, Ian M. Bell
   The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:293-307 [Journal]
   
3. John W. Sheppard, S. G. W. Butcher
   A Formal Analysis of Fault Diagnosis with D-matrices. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:309-322 [Journal]
   
4. M. A. El-Gamal, M. D. A. Mohamed
   Ensembles of Neural Networks for Fault Diagnosis in Analog Circuits. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:323-339 [Journal]
   
5. Katherine Shu-Min Li, Chung-Len Lee, Chauchin Su, Jwu E. Chen
   IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:341-355 [Journal]
   
6. Sunghoon Chun, YongJoon Kim, Sungho Kang
   MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:357-362 [Journal]
   
7. Mohammad Gh. Mohammad, Laila Terkawi
   Techniques for Disturb Fault Collapsing. [Citation Graph (0, 0)][DBLP]
   J. Electronic Testing, 2007, v:23, n:4, pp:363-368 [Journal]