Journals in DBLP

IEEE Computer
1996, volume: 29, number: 11

1. Rohit Kapur, Edward F. Miller
   System Test and Reliability: Techniques for Avoiding Failure (Guest Editors' Introduction). [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:28-30 [Journal]
   
2. Brian T. Murray, John P. Hayes
   Testing ICs: Getting to the Core of the Problem. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:32-38 [Journal]
   
3. Bernd Könemann, Ben Bennetts, Najmi T. Jarwala, Benoit Nadeau-Dostie
   Built-In Self-Test: Assuring System Integrity. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:39-45 [Journal]
   
4. Deborah T. Marr, Subramanian Natarajan, Shreekant S. Thakkar, Richard Zucker
   Multiprocessor Validation of the Pentium Pro. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:47-53 [Journal]
   
5. Joseph A. Profeta III, Nikos P. Andrianos, Bing Yu, Barry W. Johnson, Todd A. DeLong, David Guaspari, Damir Jamsek
   Safety-Critical Systems Built with COTS. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:54-60 [Journal]
   
6. John D. Musa
   Software-Reliability-Engineered Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:61-68 [Journal]
   
7. Alan Wood
   Predicting Software Reliability. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:69-77 [Journal]
   
8. Thomas Drake
   Measuring Software Quality: A Case Study. [Citation Graph (0, 0)][DBLP]
   IEEE Computer, 1996, v:29, n:11, pp:78-87 [Journal]