Journals in DBLP

IEEE Design & Test of Computers
2008, volume: 25, number: 1

1. 
   From the EIC. [Citation Graph (, )][DBLP]
   
   
2. 
   Guest Editors' Introduction: The Evolution of RFIC Design and Test. [Citation Graph (, )][DBLP]
   
   
3. 
   Design and Analysis of a Transversal Filter RFIC in SiGe Technology. [Citation Graph (, )][DBLP]
   
   
4. 
   Design of a Low-Noise UWB Transceiver SiP. [Citation Graph (, )][DBLP]
   
   
5. 
   Decreasing Test Qualification Time in AMS and RF Systems. [Citation Graph (, )][DBLP]
   
   
6. 
   Light-Enhanced FET Switch Improves ATE RF Power Settling. [Citation Graph (, )][DBLP]
   
   
7. 
   Time-Division-Multiplexed Test Delivery for NoC Systems. [Citation Graph (, )][DBLP]
   
   
8. 
   Low-Impact Processor for Dynamic Runtime Power Management. [Citation Graph (, )][DBLP]
   
   
9. 
   Hybrid-SBST Methodology for Efficient Testing of Processor Cores. [Citation Graph (, )][DBLP]
   
   
10. 
    Simultaneous Switching Noise: The Relation between Bus Layout and Coding. [Citation Graph (, )][DBLP]
    
    
11. 
    How to make your own processor architecture. [Citation Graph (, )][DBLP]
    
    
12. 
    DATC Newsletter. [Citation Graph (, )][DBLP]
    
    
13. 
    TTTC Newsletter. [Citation Graph (, )][DBLP]
    
    
14. 
    Changing times in the RF world. [Citation Graph (, )][DBLP]