Journals in DBLP

IEEE Design & Test of Computers
2009, volume: 26, number: 6

1. 
   Design for reliability and robustness. [Citation Graph (, )][DBLP]
   
   
2. 
   Guest Editors' Introduction: Reliability Challenges in Nano-CMOS Design. [Citation Graph (, )][DBLP]
   
   
3. 
   Reliability Implications of Bias-Temperature Instability in Digital ICs. [Citation Graph (, )][DBLP]
   
   
4. 
   Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements. [Citation Graph (, )][DBLP]
   
   
5. 
   Overcoming Early-Life Failure and Aging for Robust Systems. [Citation Graph (, )][DBLP]
   
   
6. 
   Sensor-Driven Reliability and Wearout Management. [Citation Graph (, )][DBLP]
   
   
7. 
   A Novel Simulation Fault Injection Method for Dependability Analysis. [Citation Graph (, )][DBLP]
   
   
8. 
   Reliability Challenges and System Performance at the Architecture Level. [Citation Graph (, )][DBLP]
   
   
9. 
   EOC: Electronic Building Blocks for Embedded Systems. [Citation Graph (, )][DBLP]
   
   
10. 
    Accelerating Emulation and Providing Full Chip Observability and Controllability. [Citation Graph (, )][DBLP]
    
    
11. 
    Conference Reports. [Citation Graph (, )][DBLP]
    
    
12. 
    Test Technology TC Newsletter. [Citation Graph (, )][DBLP]
    
    
13. 
    Book Reviews: A guide for the wrapper perplexed. [Citation Graph (, )][DBLP]
    
    
14. 
    CEDA Currents. [Citation Graph (, )][DBLP]
    
    
15. 
    Design Automation Technical Committee Newsletter. [Citation Graph (, )][DBLP]
    
    
16. 
    The Last Byte: Too many reboots. [Citation Graph (, )][DBLP]