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Journals in DBLP

IEEE Design & Test of Computers
2009, volume: 26, number: 1


  1. Guest Editors' Introduction: The Status of IEEE Std 1500. [Citation Graph (, )][DBLP]


  2. IEEE Std 1500 Enables Modular SoC Testing. [Citation Graph (, )][DBLP]


  3. Improved Core Isolation and Access for Hierarchical Embedded Test. [Citation Graph (, )][DBLP]


  4. Turbo1500: Core-Based Design for Test and Diagnosis. [Citation Graph (, )][DBLP]


  5. CTL and Its Usage in the EDA Industry. [Citation Graph (, )][DBLP]


  6. The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper. [Citation Graph (, )][DBLP]


  7. Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. [Citation Graph (, )][DBLP]


  8. Algorithmic Concurrent Error Detection in Complex Digital-Processing Systems. [Citation Graph (, )][DBLP]


  9. Logic Mapping in Crossbar-Based Nanoarchitectures. [Citation Graph (, )][DBLP]


  10. A CMOS Resizing Methodology for Analog Circuits. [Citation Graph (, )][DBLP]


  11. The Challenges of Nanotechnology and Gigacomplexity. [Citation Graph (, )][DBLP]


  12. A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. [Citation Graph (, )][DBLP]


  13. We need more standards like IEEE 1500. [Citation Graph (, )][DBLP]

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