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Journals in DBLP
Guest Editors' Introduction: The Status of IEEE Std 1500. [Citation Graph (, )][DBLP]
IEEE Std 1500 Enables Modular SoC Testing. [Citation Graph (, )][DBLP]
Improved Core Isolation and Access for Hierarchical Embedded Test. [Citation Graph (, )][DBLP]
Turbo1500: Core-Based Design for Test and Diagnosis. [Citation Graph (, )][DBLP]
CTL and Its Usage in the EDA Industry. [Citation Graph (, )][DBLP]
The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper. [Citation Graph (, )][DBLP]
Test Access Mechanism in the Quad-Core AMD Opteron Microprocessor. [Citation Graph (, )][DBLP]
Algorithmic Concurrent Error Detection in Complex Digital-Processing Systems. [Citation Graph (, )][DBLP]
Logic Mapping in Crossbar-Based Nanoarchitectures. [Citation Graph (, )][DBLP]
A CMOS Resizing Methodology for Analog Circuits. [Citation Graph (, )][DBLP]
The Challenges of Nanotechnology and Gigacomplexity. [Citation Graph (, )][DBLP]
A second course on testing [review of System on Chip Test Architectures (Wang, L.-T et al., Eds.; 2007)]. [Citation Graph (, )][DBLP]
We need more standards like IEEE 1500. [Citation Graph (, )][DBLP]
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