The SCEAS System | ||||
Paper infoM. Fadlallah, A. Szewczyk, C. Giannakopoulos, B. Cretu, F. Monsieur, T. Devoivre, J. Jomaah, G. GhibaudoLow frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:9-10, pp:1361-1366 [Journal] Scores and Rank SCEAS: 0.41721 SCEAS_PS: 0 SCEAS_BPS: 0 SCEAS_EPS: 0 SCEAS_BEPS: 0 SCEAS_B0: 3.11202 PAGE_RANK: 0.48050 HITS_H: 0 HITS_A: 0 BHITS_H: 0 BHITS_A: 0 SALSA_A: 0 SALSA_H: 0 BSALSA_A: 0 BSALSA_H: 0 P: 0 BCC: 0 citations_to_me: 0 citations_from_me: 0 Graph produced by graphviz-1.8.5 | ||||
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System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002 for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002 |