The SCEAS System | ||||
Paper infoC. Zhao, G. Roebben, H. Bender, E. Young, S. Haukka, M. Houssa, M. Naili, Stefan De Gendt, M. Heyns, O. Van Der BiestIn situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:7, pp:995-998 [Journal] Scores and Rank SCEAS: 0.41721 SCEAS_PS: 0 SCEAS_BPS: 0 SCEAS_EPS: 0 SCEAS_BEPS: 0 SCEAS_B0: 3.11202 PAGE_RANK: 0.48050 HITS_H: 0 HITS_A: 0 BHITS_H: 0 BHITS_A: 0 SALSA_A: 0 SALSA_H: 0 BSALSA_A: 0 BSALSA_H: 0 P: 0 BCC: 0 citations_to_me: 0 citations_from_me: 0 Graph produced by graphviz-1.8.5 | ||||
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System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002 for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002 |