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Dimitrios N. Kouvatsos
On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors. [Citation Graph (0, 0)][DBLP]
Microelectronics Reliability, 2002, v:42, n:12, pp:1875-1882 [Journal]

Scores and Rank
SCEAS: 0.41721
SCEAS_PS: 0
SCEAS_BPS: 0
SCEAS_EPS: 0
SCEAS_BEPS: 0
SCEAS_B0: 3.11202
PAGE_RANK: 0.48050
HITS_H: 0
HITS_A: 0
BHITS_H: 0
BHITS_A: 0
SALSA_A: 0
SALSA_H: 0
BSALSA_A: 0
BSALSA_H: 0
P: 0
BCC: 0
citations_to_me: 0
citations_from_me: 0



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