The SCEAS System | ||||
Paper infoK. L. Ng, Nian Zhan, C. W. Kok, M. C. Poon, Hei WongElectrical characterization of the hafnium oxide prepared by direct sputtering of Hf in oxygen with rapid thermal annealing. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:8, pp:1289-1293 [Journal] Scores and Rank SCEAS: 0.41721 SCEAS_PS: 0 SCEAS_BPS: 0 SCEAS_EPS: 0 SCEAS_BEPS: 0 SCEAS_B0: 3.11202 PAGE_RANK: 0.48050 HITS_H: 0 HITS_A: 0 BHITS_H: 0 BHITS_A: 0 SALSA_A: 0 SALSA_H: 0 BSALSA_A: 0 BSALSA_H: 0 P: 0 BCC: 0 citations_to_me: 0 citations_from_me: 0 Graph produced by graphviz-1.8.5 | ||||
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System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002 for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002 |