The SCEAS System | ||||
Paper infoW. D. van Driel, G. Q. Zhang, J. H. J. Janssen, L. J. Ernst, F. Su, Kerm Sin Chian, Sung YiPrediction and verification of process induced warpage of electronic packages. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:5, pp:765-774 [Journal] Scores and Rank SCEAS: 0.41721 SCEAS_PS: 0 SCEAS_BPS: 0 SCEAS_EPS: 0 SCEAS_BEPS: 0 SCEAS_B0: 3.11202 PAGE_RANK: 0.48050 HITS_H: 0 HITS_A: 0 BHITS_H: 0 BHITS_A: 0 SALSA_A: 0 SALSA_H: 0 BSALSA_A: 0 BSALSA_H: 0 P: 0 BCC: 0 citations_to_me: 0 citations_from_me: 0 Graph produced by graphviz-1.8.5 | ||||
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System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002 for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002 |