The SCEAS System
Navigation Menu
Introduction
Collection Based
Clustering
Ranking
Paper Based
Journals
Conferences
DB Status
Statistics
Search

Search the dblp DataBase

Title:
Author:
Tuan Pham: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill
    Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:683-692 [Conf]

  2. Subspace Vector Quantization and Markov Modeling for Cell Phase Classification. [Citation Graph (, )][DBLP]


  3. Internet Media Streaming Using Network Coding and Path Diversity. [Citation Graph (, )][DBLP]


Search in 0.001secs, Finished in 0.001secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
Introduction Collection Based Clustering Ranking Paper Based Journals Conferences DB Status Statistics Search
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002