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Tuan Pham: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Minh Quach, Tuan Pham, Tim Figal, Bob Kopitzke, Pete O'Neill
    Wafer-Level Defect-Based Testing Using Enhanced Voltage Stress and Statistical Test Data Evaluation. [Citation Graph (0, 0)][DBLP]
    ITC, 2002, pp:683-692 [Conf]

  2. Subspace Vector Quantization and Markov Modeling for Cell Phase Classification. [Citation Graph (, )][DBLP]

  3. Internet Media Streaming Using Network Coding and Path Diversity. [Citation Graph (, )][DBLP]

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