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K. Kim :
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S. Hong , K. Kim Identifying Fault Prone Modules: An Empirical Study in Telecommunication System. [Citation Graph (0, 0)][DBLP ] CSMR, 1998, pp:179-184 [Conf ] Hyung Ki Lee , Dong Sam Ha , K. Kim Test Generation of Stuck-open Faults Using Stuck-at Test Sets in CMOS Combinational Circuits. [Citation Graph (0, 0)][DBLP ] DAC, 1989, pp:345-350 [Conf ] D. B. Shu , J. Greg Nash , K. Kim Parallel Implementation of Image Understanding Tasks on Gated-Connection Networks. [Citation Graph (0, 0)][DBLP ] IPPS, 1991, pp:216-223 [Conf ] K. Kim , Lawrence J. Henschen Network-Based Simple Recursive Answer Evaluation for Deductive Databases in Parallel Environment. [Citation Graph (0, 0)][DBLP ] SEKE, 1992, pp:63-70 [Conf ] Nicholas J. Belkin , A. Cabezas , Colleen Cool , K. Kim , Kwong Bor Ng , Soyeon Park , R. Pressman , Soo Young Rieh , Pamela A. Savage-Knepshield , H. Xie Rutgers Interactive Track at TREC-5. [Citation Graph (0, 0)][DBLP ] TREC, 1996, pp:- [Conf ] H. Park , K. Kim , S-C. Lee A method for approximate NURBS curve compatibility based on multiple curve refitting. [Citation Graph (0, 0)][DBLP ] Computer-Aided Design, 2000, v:32, n:4, pp:237-252 [Journal ] Y. Chu , S. Baek , H. Yonekawa , A. Chertovskikh , M. Kim , J. S. Kim , K. Park , S. Baang , Y. Chang , J. H. Kim , S. Lee , B. Lim , W. Chung , H. Park , K. Kim Data Acquisition and Database Management System for Samsung Superconductor Test Facility [Citation Graph (0, 0)][DBLP ] CoRR, 2001, v:0, n:, pp:- [Journal ] S. Mukhopadhyay , K. Kim , C. T. Chuang , K. Roy Modeling and Analysis of Leakage Currents in Double-Gate Technologies. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:10, pp:2052-2061 [Journal ] M. Brahma , K. Kim , Abdelhafid Abouaissa , Pascal Lorenz A Load-Balancing and Push-Out Scheme for Supporting QoS in MANETs. [Citation Graph (0, 0)][DBLP ] Telecommunication Systems, 2005, v:30, n:1-3, pp:161-175 [Journal ] K. Kim , J. L. Nazareth A primal null-space affine-scaling method. [Citation Graph (0, 0)][DBLP ] ACM Trans. Math. Softw., 1994, v:20, n:3, pp:373-392 [Journal ] Y. J. Song , H. J. Joo , S. K. Kang , H. H. Kim , J. H. Park , Y. M. Kang , E. Y. Kang , S. Y. Lee , K. Kim Electrical properties of highly reliable 32Mb FRAM with advanced capacitor technology. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2005, v:45, n:7-8, pp:1150-1153 [Journal ] Statistical properties analysis of real world tournament selection in genetic algorithms. [Citation Graph (, )][DBLP ] Search in 0.003secs, Finished in 0.004secs