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Daniel G. Saab :
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Miron Abramovici , José T. de Sousa , Daniel G. Saab A Massively-Parallel Easily-Scalable Satisfiability Solver Using Reconfigurable Hardware. [Citation Graph (0, 0)][DBLP ] DAC, 1999, pp:684-690 [Conf ] David Blaauw , Daniel G. Saab , Robert B. Mueller-Thuns , Jacob A. Abraham , Joseph T. Rahmeh Automatic Generation of Behavioral Models from Switch-Level Descriptions. [Citation Graph (0, 0)][DBLP ] DAC, 1989, pp:179-184 [Conf ] Fatih Kocan , Daniel G. Saab Dynamic Fault Diagnosis on Reconfigurable Hardware. [Citation Graph (0, 0)][DBLP ] DAC, 1999, pp:691-696 [Conf ] Daniel G. Saab , Andrew T. Yang , Ibrahim N. Hajj Delay Modeling and Time of Bipolar Digital Circuits. [Citation Graph (0, 0)][DBLP ] DAC, 1988, pp:288-293 [Conf ] Elizabeth M. Rudnick , John G. Holm , Daniel G. Saab , Janak H. Patel Application of Simple Genetic Algorithms to Sequential Circuit Test Generation. [Citation Graph (0, 0)][DBLP ] EDAC-ETC-EUROASIC, 1994, pp:40-45 [Conf ] Miron Abramovici , Daniel G. Saab Satisfiability on reconfigurable hardware. [Citation Graph (0, 0)][DBLP ] FPL, 1997, pp:448-456 [Conf ] Qiang Qiang , Daniel G. Saab , Jacob A. Abraham An Emulation Model for Sequential ATPG-Based Bounded Model Checking. [Citation Graph (0, 0)][DBLP ] FPL, 2005, pp:469-474 [Conf ] Daniel G. Saab , Fatih Kocan , Jacob A. Abraham Massively Parallel/Reconfigurable Emulation Model for the D-algorithm. [Citation Graph (0, 0)][DBLP ] FPL, 2002, pp:1172-1176 [Conf ] Jen-Chieh Ou , Daniel G. Saab , Qiang Qiang , Jacob A. Abraham Reducing verification overhead with RTL slicing. [Citation Graph (0, 0)][DBLP ] ACM Great Lakes Symposium on VLSI, 2007, pp:399-404 [Conf ] David Blaauw , Robert B. Mueller-Thuns , Daniel G. Saab , Prithviraj Banerjee , Jacob A. Abraham SNEL: A Switch-Level Simulator Using Multiple Levels of Functional Abstraction. [Citation Graph (0, 0)][DBLP ] ICCAD, 1990, pp:66-69 [Conf ] Chung-Hsing Chen , Daniel G. Saab Behavioral synthesis for testability. [Citation Graph (0, 0)][DBLP ] ICCAD, 1992, pp:612-615 [Conf ] Chung-Hsing Chen , Chienwen Wu , Daniel G. Saab BETA: Behavioral Testability Analysis. [Citation Graph (0, 0)][DBLP ] ICCAD, 1991, pp:202-205 [Conf ] Gwan S. Choi , Ravishankar K. Iyer , Daniel G. Saab Fault behavior dictionary for simulation of device-level transients. [Citation Graph (0, 0)][DBLP ] ICCAD, 1993, pp:6-9 [Conf ] Fatih Kocan , Daniel G. Saab Concurrent D-algorithm on reconfigurable hardware. [Citation Graph (0, 0)][DBLP ] ICCAD, 1999, pp:152-156 [Conf ] Ben Mathew , Daniel G. Saab Augmented partial reset. [Citation Graph (0, 0)][DBLP ] ICCAD, 1993, pp:716-719 [Conf ] Daniel G. Saab , Youssef Saab , Jacob A. Abraham CRIS: a test cultivation program for sequential VLSI circuits. [Citation Graph (0, 0)][DBLP ] ICCAD, 1992, pp:216-219 [Conf ] Daniel G. Saab , Youssef Saab , Jacob A. Abraham Iterative [simulation-based genetics + deterministic techniques]= complete ATPG0. [Citation Graph (0, 0)][DBLP ] ICCAD, 1994, pp:40-43 [Conf ] Chung-Hsing Chen , Chienwen Wu , Daniel G. Saab Accessibility Analysis on Data Flow Graph: An Approach to Design for Testability. [Citation Graph (0, 0)][DBLP ] ICCD, 1991, pp:463-466 [Conf ] Qiang Qiang , Chia-Lun Chang , Daniel G. Saab , Jacob A. Abraham Case Study of ATPG-based Bounded Model Checking: Verifying USB2.0 IP Core. [Citation Graph (0, 0)][DBLP ] ICCD, 2005, pp:461-463 [Conf ] Jalal A. Wehbeh , Daniel G. Saab Hierarchical Simulation of MOS Circuits Using Extracted Functional Models. [Citation Graph (0, 0)][DBLP ] ICCD, 1992, pp:512-515 [Conf ] Antoine N. Mourad , W. Kent Fuchs , Daniel G. Saab Database Recovery Using Redundant Disk Arrays. [Citation Graph (0, 14)][DBLP ] ICDE, 1992, pp:176-183 [Conf ] Antoine N. Mourad , W. Kent Fuchs , Daniel G. Saab Assigning Sites fto Redundant Clusters in a Distributed Storage System. [Citation Graph (0, 0)][DBLP ] ICPP, 1993, pp:64-71 [Conf ] Antoine N. Mourad , W. Kent Fuchs , Daniel G. Saab Performance of Redundant Disk Array Organizations in Transaction Processing Environments. [Citation Graph (0, 0)][DBLP ] ICPP, 1993, pp:138-145 [Conf ] Jacob A. Abraham , Vivekananda M. Vedula , Daniel G. Saab Verifying Properties Using Sequential ATPG. [Citation Graph (0, 0)][DBLP ] ITC, 2002, pp:194-202 [Conf ] Miron Abramovici , Prashant S. Parikh , Ben Mathew , Daniel G. Saab On Selecting Flip-Flops for Partial Reset. [Citation Graph (0, 0)][DBLP ] ITC, 1993, pp:1008-1012 [Conf ] Ben Mathew , Daniel G. Saab DFT & ATPG: Together Again. [Citation Graph (0, 0)][DBLP ] ITC, 1995, pp:262-271 [Conf ] Praveen Vishakantaiah , Jacob A. Abraham , Daniel G. Saab CHEETA: Composition of Hierarchical Sequential Tests Using ATKET. [Citation Graph (0, 0)][DBLP ] ITC, 1993, pp:606-615 [Conf ] Jalal A. Wehbeh , Daniel G. Saab On the Initialization of Sequential Circuits. [Citation Graph (0, 0)][DBLP ] ITC, 1994, pp:233-239 [Conf ] Antoine N. Mourad , W. Kent Fuchs , Daniel G. Saab Site Partitioning for Distributed Redundant Disk Arrays. [Citation Graph (0, 0)][DBLP ] RIDE-TQP, 1992, pp:214- [Conf ] Robert B. Mueller-Thuns , Daniel G. Saab , Jacob A. Abraham Design of a scalable parallel switch-level simulator for VLSI. [Citation Graph (0, 0)][DBLP ] SC, 1990, pp:615-624 [Conf ] Qiang Qiang , Daniel G. Saab , Jacob A. Abraham Checking Nested Properties Using Bounded Model Checking and Sequential ATPG. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2006, pp:225-230 [Conf ] Daniel G. Saab , Jacob A. Abraham , Vivekananda M. Vedula Formal Verification Using Bounded Model Checking: SAT versus Sequential ATPG Engines. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2003, pp:243-248 [Conf ] Raghuram S. Tupuri , Jacob A. Abraham , Daniel G. Saab Hierarchical Test Generation for Systems On a Chip. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2000, pp:198-0 [Conf ] Jacob A. Abraham , Daniel G. Saab Tutorial T4A: Formal Verification Techniques and Tools for Complex Designs. [Citation Graph (0, 0)][DBLP ] VLSI Design, 2007, pp:6- [Conf ] Jalal A. Wehbeh , Daniel G. Saab Initialization of sequential circuits and its application to ATPG. [Citation Graph (0, 0)][DBLP ] VTS, 1996, pp:246-253 [Conf ] Antoine N. Mourad , W. Kent Fuchs , Daniel G. Saab Recovery Issues in Databases Using Redundant Disk Arrays. [Citation Graph (0, 0)][DBLP ] J. Parallel Distrib. Comput., 1993, v:17, n:1-2, pp:75-89 [Journal ] Antoine N. Mourad , W. Kent Fuchs , Daniel G. Saab Site Partitioning for Redundant Arrays of Distributed Disks. [Citation Graph (0, 0)][DBLP ] J. Parallel Distrib. Comput., 1996, v:33, n:1, pp:1-11 [Journal ] Chung-Hsing Chen , Tanay Karnik , Daniel G. Saab Structural and behavioral synthesis for testability techniques. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1994, v:13, n:6, pp:777-785 [Journal ] Chung-Hsing Chen , Daniel G. Saab A novel behavioral testability measure. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:12, pp:1960-1970 [Journal ] Ibrahim N. Hajj , Daniel G. Saab Switch-Level Logic Simulation of Digital Bipolar Circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:2, pp:251-258 [Journal ] Ben Mathew , Daniel G. Saab Combining multiple DFT schemes with test generation. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:685-696 [Journal ] Robert B. Mueller-Thuns , Daniel G. Saab , Robert F. Damiano , Jacob A. Abraham VLSI logic and fault simulation on general-purpose parallel computers. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:3, pp:446-460 [Journal ] Daniel G. Saab , Youssef Saab , Jacob A. Abraham Automatic test vector cultivation for sequential VLSI circuits using genetic algorithms. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:10, pp:1278-1285 [Journal ] Andrew T. Yang , Yu-Hsu Chang , Daniel G. Saab , Ibrahim N. Hajj Switch-level timing simulation of bipolar ECL circuits. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:4, pp:516-530 [Journal ] Robert B. Mueller-Thuns , Daniel G. Saab , Robert F. Damiano , Jacob A. Abraham Benchmarking Parallel Processing Platforms: An Applications Perspective. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Parallel Distrib. Syst., 1993, v:4, n:8, pp:947-954 [Journal ] Sankar Gurumurthy , Ramtilak Vemu , Jacob A. Abraham , Daniel G. Saab Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. [Citation Graph (0, 0)][DBLP ] European Test Symposium, 2007, pp:173-178 [Conf ] Daniel G. Saab Parallel-concurrent fault simulation. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 1993, v:1, n:3, pp:356-364 [Journal ] Fatih Kocan , Daniel G. Saab ATPG for combinational circuits on configurable hardware. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2001, v:9, n:1, pp:117-129 [Journal ] Fatih Kocan , Daniel G. Saab Correction to "ATPG for combinational circuits on configurable hardware". [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2002, v:10, n:3, pp:374-374 [Journal ] Ultralow-Power Reconfigurable Computing with Complementary Nano-Electromechanical Carbon Nanotube Switches. [Citation Graph (, )][DBLP ] Critical Path Delay Reduction in FPGAs with Unbalanced Lookup Times. [Citation Graph (, )][DBLP ] Derivation of signal flow for switch-level simulation. [Citation Graph (, )][DBLP ] Complementary nano-electromechanical switches for ultra-low power embedded processors. [Citation Graph (, )][DBLP ] Search in 0.023secs, Finished in 0.025secs