The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Frank Liu: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Kanak Agarwal, Dennis Sylvester, David Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula
    Variational delay metrics for interconnect timing analysis. [Citation Graph (0, 0)][DBLP]
    DAC, 2004, pp:381-384 [Conf]
  2. Charles J. Alpert, Frank Liu, Chandramouli V. Kashyap, Anirudh Devgan
    Delay and slew metrics using the lognormal distribution. [Citation Graph (0, 0)][DBLP]
    DAC, 2003, pp:382-385 [Conf]
  3. Haihua Su, David Widiger, Chandramouli V. Kashyap, Frank Liu, Byron Krauter
    A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis. [Citation Graph (0, 0)][DBLP]
    DAC, 2005, pp:186-189 [Conf]
  4. Frank Liu
    A practical method to estimate interconnect responses to variabilities. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:545-546 [Conf]
  5. Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif
    Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:958-963 [Conf]
  6. Ganesh Venkataraman, Jiang Hu, Frank Liu, Cliff C. N. Sze
    Integrated placement and skew optimization for rotary clocking. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:756-761 [Conf]
  7. Peter Feldmann, F. Liu
    Sparse and efficient reduced order modeling of linear subcircuits with large number of terminals. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2004, pp:88-92 [Conf]
  8. Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert
    A delay metric for RC circuits based on the Weibull distribution. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2002, pp:620-624 [Conf]
  9. Rahul M. Rao, Frank Liu, Jeffrey L. Burns, Richard B. Brown
    A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2003, pp:689-692 [Conf]
  10. Xiaoji Ye, Peng Li, Frank Liu
    Practical variation-aware interconnect delay and slew analysis for statistical timing verification. [Citation Graph (0, 0)][DBLP]
    ICCAD, 2006, pp:54-59 [Conf]
  11. Haihua Su, Frank Liu, Anirudh Devgan, Emrah Acar, Sani R. Nassif
    Full chip leakage estimation considering power supply and temperature variations. [Citation Graph (0, 0)][DBLP]
    ISLPED, 2003, pp:78-83 [Conf]
  12. Chandramouli V. Kashyap, Charles J. Alpert, Frank Liu, Anirudh Devgan
    Closed form expressions for extending step delay and slew metrics to ramp inputs. [Citation Graph (0, 0)][DBLP]
    ISPD, 2003, pp:24-31 [Conf]
  13. Anand Ramalingam, David Z. Pan, Frank Liu, Sani R. Nassif
    Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity. [Citation Graph (0, 0)][DBLP]
    ISQED, 2006, pp:644-649 [Conf]
  14. Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu
    Test structures for delay variability. [Citation Graph (0, 0)][DBLP]
    Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:109- [Conf]
  15. Chandramouli V. Kashyap, Charles J. Alpert, Frank Liu, Anirudh Devgan
    PERI: a technique for extending delay and slew metrics to ramp inputs. [Citation Graph (0, 0)][DBLP]
    Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:57-62 [Conf]
  16. Charles J. Alpert, Frank Liu, Chandramouli V. Kashyap, Anirudh Devgan
    Closed-form delay and slew metrics made easy. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:12, pp:1661-1669 [Journal]
  17. Chandramouli V. Kashyap, Charles J. Alpert, Frank Liu, Anirudh Devgan
    Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:4, pp:509-516 [Journal]
  18. Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert
    A delay metric for RC circuits based on the Weibull distribution. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:3, pp:443-447 [Journal]
  19. Frank Liu
    A General Framework for Spatial Correlation Modeling in VLSI Design. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:817-822 [Conf]
  20. Ritu Singhal, Asha Balijepalli, Anupama Subramaniam, Frank Liu, Sani R. Nassif, Yu Cao
    Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:823-828 [Conf]
  21. Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Rakesh Vattikonda, Sarma B. K. Vrudhula, Frank Liu, Yu Cao
    The Impact of NBTI on the Performance of Combinational and Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    DAC, 2007, pp:364-369 [Conf]
  22. Min Chen, Wei Zhao, Frank Liu, Yu Cao
    Fast statistical circuit analysis with finite-point based transistor model. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:1391-1396 [Conf]
  23. Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif
    Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]
  24. Ram Bhuwan Pandit, Juming Tang, Frank Liu, Galina Mikhaylenko
    A computer vision method to locate cold spots in foods in microwave sterilization processes. [Citation Graph (0, 0)][DBLP]
    Pattern Recognition, 2007, v:40, n:12, pp:3667-3676 [Journal]
  25. Xiaoji Ye, Frank Liu, Peng Li
    Fast Variational Interconnect Delay and Slew Computation Using Quadratic Models. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:8, pp:913-926 [Journal]
  26. Ganesh Venkataraman, Jiang Hu, Frank Liu
    Integrated Placement and Skew Optimization for Rotary Clocking. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2007, v:15, n:2, pp:149-158 [Journal]

  27. A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects. [Citation Graph (, )][DBLP]


  28. Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness. [Citation Graph (, )][DBLP]


  29. Variability analysis under layout pattern-dependent rapid-thermal annealing process. [Citation Graph (, )][DBLP]


  30. Predicting variability in nanoscale lithography processes. [Citation Graph (, )][DBLP]


  31. An efficient method for statistical circuit simulation. [Citation Graph (, )][DBLP]


  32. Efficient computation of current flow in signal wires for reliability analysis. [Citation Graph (, )][DBLP]


  33. Modeling of layout-dependent stress effect in CMOS design. [Citation Graph (, )][DBLP]


  34. A Root-Finding Method for Assessing SRAM Stability. [Citation Graph (, )][DBLP]


  35. MAISE: An Interconnect Simulation Engine for Timing and Noise Analysis. [Citation Graph (, )][DBLP]


  36. Guest Editors' Introduction: Compact Variability Modeling in Scaled CMOS Design. [Citation Graph (, )][DBLP]


Search in 0.002secs, Finished in 0.304secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002