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Frank Liu :
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Kanak Agarwal , Dennis Sylvester , David Blaauw , Frank Liu , Sani R. Nassif , Sarma B. K. Vrudhula Variational delay metrics for interconnect timing analysis. [Citation Graph (0, 0)][DBLP ] DAC, 2004, pp:381-384 [Conf ] Charles J. Alpert , Frank Liu , Chandramouli V. Kashyap , Anirudh Devgan Delay and slew metrics using the lognormal distribution. [Citation Graph (0, 0)][DBLP ] DAC, 2003, pp:382-385 [Conf ] Haihua Su , David Widiger , Chandramouli V. Kashyap , Frank Liu , Byron Krauter A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis. [Citation Graph (0, 0)][DBLP ] DAC, 2005, pp:186-189 [Conf ] Frank Liu A practical method to estimate interconnect responses to variabilities. [Citation Graph (0, 0)][DBLP ] DATE, 2006, pp:545-546 [Conf ] Peng Li , Frank Liu , Xin Li , Lawrence T. Pileggi , Sani R. Nassif Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction. [Citation Graph (0, 0)][DBLP ] DATE, 2005, pp:958-963 [Conf ] Ganesh Venkataraman , Jiang Hu , Frank Liu , Cliff C. N. Sze Integrated placement and skew optimization for rotary clocking. [Citation Graph (0, 0)][DBLP ] DATE, 2006, pp:756-761 [Conf ] Peter Feldmann , F. Liu Sparse and efficient reduced order modeling of linear subcircuits with large number of terminals. [Citation Graph (0, 0)][DBLP ] ICCAD, 2004, pp:88-92 [Conf ] Frank Liu , Chandramouli V. Kashyap , Charles J. Alpert A delay metric for RC circuits based on the Weibull distribution. [Citation Graph (0, 0)][DBLP ] ICCAD, 2002, pp:620-624 [Conf ] Rahul M. Rao , Frank Liu , Jeffrey L. Burns , Richard B. Brown A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits. [Citation Graph (0, 0)][DBLP ] ICCAD, 2003, pp:689-692 [Conf ] Xiaoji Ye , Peng Li , Frank Liu Practical variation-aware interconnect delay and slew analysis for statistical timing verification. [Citation Graph (0, 0)][DBLP ] ICCAD, 2006, pp:54-59 [Conf ] Haihua Su , Frank Liu , Anirudh Devgan , Emrah Acar , Sani R. Nassif Full chip leakage estimation considering power supply and temperature variations. [Citation Graph (0, 0)][DBLP ] ISLPED, 2003, pp:78-83 [Conf ] Chandramouli V. Kashyap , Charles J. Alpert , Frank Liu , Anirudh Devgan Closed form expressions for extending step delay and slew metrics to ramp inputs. [Citation Graph (0, 0)][DBLP ] ISPD, 2003, pp:24-31 [Conf ] Anand Ramalingam , David Z. Pan , Frank Liu , Sani R. Nassif Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity. [Citation Graph (0, 0)][DBLP ] ISQED, 2006, pp:644-649 [Conf ] Duane S. Boning , Joseph Panganiban , Karen Gonzalez-Valentin , Sani R. Nassif , Chandler McDowell , Anne E. Gattiker , Frank Liu Test structures for delay variability. [Citation Graph (0, 0)][DBLP ] Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:109- [Conf ] Chandramouli V. Kashyap , Charles J. Alpert , Frank Liu , Anirudh Devgan PERI: a technique for extending delay and slew metrics to ramp inputs. [Citation Graph (0, 0)][DBLP ] Timing Issues in the Specification and Synthesis of Digital Systems, 2002, pp:57-62 [Conf ] Charles J. Alpert , Frank Liu , Chandramouli V. Kashyap , Anirudh Devgan Closed-form delay and slew metrics made easy. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:12, pp:1661-1669 [Journal ] Chandramouli V. Kashyap , Charles J. Alpert , Frank Liu , Anirudh Devgan Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:4, pp:509-516 [Journal ] Frank Liu , Chandramouli V. Kashyap , Charles J. Alpert A delay metric for RC circuits based on the Weibull distribution. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:3, pp:443-447 [Journal ] Frank Liu A General Framework for Spatial Correlation Modeling in VLSI Design. [Citation Graph (0, 0)][DBLP ] DAC, 2007, pp:817-822 [Conf ] Ritu Singhal , Asha Balijepalli , Anupama Subramaniam , Frank Liu , Sani R. Nassif , Yu Cao Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. [Citation Graph (0, 0)][DBLP ] DAC, 2007, pp:823-828 [Conf ] Wenping Wang , Shengqi Yang , Sarvesh Bhardwaj , Rakesh Vattikonda , Sarma B. K. Vrudhula , Frank Liu , Yu Cao The Impact of NBTI on the Performance of Combinational and Sequential Circuits. [Citation Graph (0, 0)][DBLP ] DAC, 2007, pp:364-369 [Conf ] Min Chen , Wei Zhao , Frank Liu , Yu Cao Fast statistical circuit analysis with finite-point based transistor model. [Citation Graph (0, 0)][DBLP ] DATE, 2007, pp:1391-1396 [Conf ] Peng Li , Frank Liu , Xin Li , Lawrence T. Pileggi , Sani R. Nassif Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction [Citation Graph (0, 0)][DBLP ] CoRR, 2007, v:0, n:, pp:- [Journal ] Ram Bhuwan Pandit , Juming Tang , Frank Liu , Galina Mikhaylenko A computer vision method to locate cold spots in foods in microwave sterilization processes. [Citation Graph (0, 0)][DBLP ] Pattern Recognition, 2007, v:40, n:12, pp:3667-3676 [Journal ] Xiaoji Ye , Frank Liu , Peng Li Fast Variational Interconnect Delay and Slew Computation Using Quadratic Models. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2007, v:15, n:8, pp:913-926 [Journal ] Ganesh Venkataraman , Jiang Hu , Frank Liu Integrated Placement and Skew Optimization for Rotary Clocking. [Citation Graph (0, 0)][DBLP ] IEEE Trans. VLSI Syst., 2007, v:15, n:2, pp:149-158 [Journal ] A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects. [Citation Graph (, )][DBLP ] Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness. [Citation Graph (, )][DBLP ] Variability analysis under layout pattern-dependent rapid-thermal annealing process. [Citation Graph (, )][DBLP ] Predicting variability in nanoscale lithography processes. [Citation Graph (, )][DBLP ] An efficient method for statistical circuit simulation. [Citation Graph (, )][DBLP ] Efficient computation of current flow in signal wires for reliability analysis. [Citation Graph (, )][DBLP ] Modeling of layout-dependent stress effect in CMOS design. [Citation Graph (, )][DBLP ] A Root-Finding Method for Assessing SRAM Stability. [Citation Graph (, )][DBLP ] MAISE: An Interconnect Simulation Engine for Timing and Noise Analysis. [Citation Graph (, )][DBLP ] Guest Editors' Introduction: Compact Variability Modeling in Scaled CMOS Design. [Citation Graph (, )][DBLP ] Search in 0.013secs, Finished in 0.016secs