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Ahmad A. Al-Yamani: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Ahmad A. Al-Yamani
    DFT for controlled-impedance I/O buffers. [Citation Graph (0, 0)][DBLP]
    DAC, 2006, pp:405-410 [Conf]
  2. Ahmad A. Al-Yamani, Edward J. McCluskey
    Seed encoding with LFSRs and cellular automata. [Citation Graph (0, 0)][DBLP]
    DAC, 2003, pp:560-565 [Conf]
  3. Ahmad A. Al-Yamani, Narendra Devta-Prasanna, Arun Gunda
    Should Illinois-Scan Based Architectures be Centralized or Distributed? [Citation Graph (0, 0)][DBLP]
    DFT, 2005, pp:406-414 [Conf]
  4. Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
    Testing Digital Circuits with Constraints. [Citation Graph (0, 0)][DBLP]
    DFT, 2002, pp:195-206 [Conf]
  5. Ahmad A. Al-Yamani, Nahmsuk Oh, Edward J. McCluskey
    Performance Evaluation of Checksum-Based ABFT. [Citation Graph (0, 0)][DBLP]
    DFT, 2001, pp:461-0 [Conf]
  6. Ahmad A. Al-Yamani, Sadiq M. Sait, Hassan Barada, Habib Youssef
    Parallel Tabu Search in a Heterogeneous Environment. [Citation Graph (0, 0)][DBLP]
    IPDPS, 2003, pp:56- [Conf]
  7. Ahmad A. Al-Yamani, Edward J. McCluskey
    BIST-Guided ATPG. [Citation Graph (0, 0)][DBLP]
    ISQED, 2005, pp:244-249 [Conf]
  8. S. Ramsundar, Ahmad A. Al-Yamani, Dhiraj K. Pradhan
    Defect Tolerance in Nanotechnology Switches Using a Greedy Reconfiguration Algorithm. [Citation Graph (0, 0)][DBLP]
    ISQED, 2007, pp:807-813 [Conf]
  9. Ahmad A. Al-Yamani, Erik Chmelar, Mikhail Grinchuck
    Segmented Addressable Scan Architecture. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:405-411 [Conf]
  10. Ahmad A. Al-Yamani, Edward J. McCluskey
    Built-In Reseeding for Serial Bist. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:63-68 [Conf]
  11. Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
    Bist Reseeding with very few Seeds. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:69-76 [Conf]
  12. Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, Francois-Fabien Ferhani, Edward Li, Subhasish Mitra
    ELF-Murphy Data on Defects and Test Sets. [Citation Graph (0, 0)][DBLP]
    VTS, 2004, pp:16-22 [Conf]
  13. Intaik Park, Ahmad A. Al-Yamani, Edward J. McCluskey
    Effective TARO Pattern Generation. [Citation Graph (0, 0)][DBLP]
    VTS, 2005, pp:161-166 [Conf]
  14. Ahmad A. Al-Yamani, Sadiq M. Sait, Habib Youssef, Hassan Barada
    Parallelizing Tabu Search on a Cluster of Heterogeneous Workstations. [Citation Graph (0, 0)][DBLP]
    J. Heuristics, 2002, v:8, n:3, pp:277-304 [Journal]
  15. Ahmad A. Al-Yamani, Subhasish Mitra, Edward J. McCluskey
    Optimized reseeding by seed ordering and encoding. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2005, v:24, n:2, pp:264-270 [Journal]
  16. Ahmad A. Al-Yamani, Edward J. McCluskey
    Test chip experimental results on high-level structural test. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:690-701 [Journal]

  17. Systematic Scan Reconfiguration. [Citation Graph (, )][DBLP]

  18. Increasing memory yield in future technologies through innovative design. [Citation Graph (, )][DBLP]

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