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James Tschanz:
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Publications of Author
- Shekhar Borkar, Tanay Karnik, Siva Narendra, James Tschanz, Ali Keshavarzi, Vivek De
Parameter variations and impact on circuits and microarchitecture. [Citation Graph (0, 0)][DBLP] DAC, 2003, pp:338-342 [Conf]
- Tanay Karnik, Yibin Ye, James Tschanz, Liqiong Wei, Steven M. Burns, Venkatesh Govindarajulu, Vivek De, Shekhar Borkar
Total power optimization by simultaneous dual-Vt allocation and device sizing in high performance microprocessors. [Citation Graph (0, 0)][DBLP] DAC, 2002, pp:486-491 [Conf]
- James Tschanz, Keith A. Bowman, Vivek De
Variation-tolerant circuits: circuit solutions and techniques. [Citation Graph (0, 0)][DBLP] DAC, 2005, pp:762-763 [Conf]
- Maged Ghoneima, Yehea I. Ismail, Muhammad M. Khellah, James Tschanz, Vivek De
Serial-link bus: a low-power on-chip bus architecture. [Citation Graph (0, 0)][DBLP] ICCAD, 2005, pp:541-546 [Conf]
- Muhammad M. Khellah, Maged Ghoneima, James Tschanz, Yibin Ye, Nasser Kurd, Javed Barkatullah, Srikanth Nimmagadda, Yehea I. Ismail
A Skewed Repeater Bus Architecture for On-Chip Energy Reduction in Microprocessors. [Citation Graph (0, 0)][DBLP] ICCD, 2005, pp:253-257 [Conf]
- Yehea I. Ismail, Muhammad M. Khellah, Maged Ghoneima, James Tschanz, Yibin Ye, Vivek De
Skewing adjacent line repeaters to reduce the delay and energy dissipation of on-chip buses. [Citation Graph (0, 0)][DBLP] ISCAS (1), 2005, pp:592-595 [Conf]
- James Tschanz, Siva Narendra, Ali Keshavarzi, Vivek De
Adaptive circuit techniques to minimize variation impacts on microprocessor performance and power. [Citation Graph (0, 0)][DBLP] ISCAS (1), 2005, pp:9-12 [Conf]
- James Tschanz, Siva Narendra, Zhanping Chen, Shekhar Borkar, Manoj Sachdev, Vivek De
Comparative delay and energy of single edge-triggered & dual edge-triggered pulsed flip-flops for high-performance microprocessors. [Citation Graph (0, 0)][DBLP] ISLPED, 2001, pp:147-152 [Conf]
- Keith A. Bowman, James Tschanz, Muhammad M. Khellah, Maged Ghoneima, Yehea I. Ismail, Vivek De
Time-borrowing multi-cycle on-chip interconnects for delay variation tolerance. [Citation Graph (0, 0)][DBLP] ISLPED, 2006, pp:79-84 [Conf]
- James Tschanz
SUB 45nm Low Power Design Challenges. [Citation Graph (0, 0)][DBLP] ISQED, 2007, pp:4- [Conf]
- Gerhard Knoblinger, James Tschanz, Marcal Pol
SUB-45nm Technology and Design Challenges. [Citation Graph (0, 0)][DBLP] ISQED, 2007, pp:3- [Conf]
- Siva Narendra, Vasantha Erraguntla, James Tschanz, Nitin Borkar
Design Challenges in Sub-100nm High Performance Microprocessors. [Citation Graph (0, 0)][DBLP] VLSI Design, 2004, pp:15-17 [Conf]
- James Tschanz
Session Abstract. [Citation Graph (0, 0)][DBLP] VTS, 2006, pp:378-379 [Conf]
- Ali Keshavarzi, James Tschanz, Siva Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins
Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2002, v:19, n:5, pp:36-43 [Journal]
- Maged Ghoneima, Yehea I. Ismail, Muhammad M. Khellah, James Tschanz, Vivek De
Formal derivation of optimal active shielding for low-power on-chip buses. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:5, pp:821-836 [Journal]
- Steven M. Burns, Mahesh Ketkar, Noel Menezes, Keith A. Bowman, James Tschanz, Vivek De
Comparative Analysis of Conventional and Statistical Design Techniques. [Citation Graph (0, 0)][DBLP] DAC, 2007, pp:238-243 [Conf]
- Ming Zhang, T. M. Mak, James Tschanz, Kee Sup Kim, Norbert Seifert, Davia Lu
Design for Resilience to Soft Errors and Variations. [Citation Graph (0, 0)][DBLP] IOLTS, 2007, pp:23-28 [Conf]
- Osman S. Unsal, James Tschanz, Keith A. Bowman, Vivek De, Xavier Vera, Antonio González, Oguz Ergin
Impact of Parameter Variations on Circuits and Microarchitecture. [Citation Graph (0, 0)][DBLP] IEEE Micro, 2006, v:26, n:6, pp:30-39 [Journal]
Circuit techniques for dynamic variation tolerance. [Citation Graph (, )][DBLP]
Resilient circuits - Enabling energy-efficient performance and reliability. [Citation Graph (, )][DBLP]
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