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Marcelo Negreiros: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Luigi Carro, Marcelo Negreiros
    Efficient Analog Test Methodology Based on Adaptive Algorithms. [Citation Graph (0, 0)][DBLP]
    DAC, 1998, pp:32-37 [Conf]
  2. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Ultimate low cost analog BIST. [Citation Graph (0, 0)][DBLP]
    DAC, 2003, pp:570-573 [Conf]
  3. Luigi Carro, Adão Antônio de Souza Jr., Marcelo Negreiros, Gabriel Parmegiani Jahn, Denis Teixeira Franco
    Non-Linear Components for Mixed Circuits Analog Front-End. [Citation Graph (0, 0)][DBLP]
    DATE, 2000, pp:544-0 [Conf]
  4. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Low Cost Analog Testing of RF Signal Paths. [Citation Graph (0, 0)][DBLP]
    DATE, 2004, pp:292-297 [Conf]
  5. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Noise Figure Evaluation Using Low Cost BIST. [Citation Graph (0, 0)][DBLP]
    DATE, 2005, pp:158-163 [Conf]
  6. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    An improved RF loopback for test time reduction. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:646-651 [Conf]
  7. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    A Statistical Sampler for a New On-line Analog Test Method. [Citation Graph (0, 0)][DBLP]
    IOLTW, 2002, pp:79-0 [Conf]
  8. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Low Cost On-Line Testing of RF Circuits. [Citation Graph (0, 0)][DBLP]
    IOLTS, 2004, pp:73-78 [Conf]
  9. Marcelo Negreiros, Erik Schüler, Luigi Carro, Altamiro Amadeu Susin
    Testing RF Signal Paths Using Spectral Analysis and Subsampling. [Citation Graph (0, 0)][DBLP]
    SBCCI, 2003, pp:329-0 [Conf]
  10. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Ultra Low Cost Analog BIST Using Spectral Analysis. [Citation Graph (0, 0)][DBLP]
    VTS, 2003, pp:77-82 [Conf]
  11. Marcelo Negreiros, Adão Antônio de Souza Jr., Luigi Carro, Altamiro Amadeu Susin
    RF Digital Signal Generation Beyond Nyquist. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:15-22 [Conf]
  12. Luigi Carro, Marcelo Negreiros, Gabriel Parmegiani Jahn, Adão Antônio de Souza Jr., Denis Teixeira Franco
    Circuit-Level Considerations for Mixed-Signal Programmable Components. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2003, v:20, n:1, pp:76-84 [Journal]
  13. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Digital Generation of Signals for Low Cost RF BIST. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:49-54 [Conf]
  14. Erik Schüler, Marcelo Negreiros, Pascal Nouet, Luigi Carro
    A Digitally Testable Capacitance-Insensitive Mixed-Signal Filter. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:21-28 [Conf]
  15. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Noise Figure Evaluation Using Low Cost BIST [Citation Graph (0, 0)][DBLP]
    CoRR, 2007, v:0, n:, pp:- [Journal]
  16. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Testing analog circuits using spectral analysis. [Citation Graph (0, 0)][DBLP]
    Microelectronics Journal, 2003, v:34, n:10, pp:937-944 [Journal]
  17. Maria Da Gloria Flores, Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin, Felipe R. Clayton, Cristiano Benevento
    Low Cost BIST for Static and Dynamic Testing of ADCs. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:3, pp:283-290 [Journal]
  18. Marcelo Negreiros, Luigi Carro, Altamiro Amadeu Susin
    Low Cost On-Line Testing Strategy for RF Circuits. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2005, v:21, n:4, pp:417-427 [Journal]

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