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Publications of Author

1. Mango Chia-Tso Chao, Kwang-Ting Cheng, Seongmoon Wang, Srimat T. Chakradhar, Wen-Long Wei
   Unknown-tolerance analysis and test-quality control for test response compaction using space compactors. [Citation Graph (0, 0)][DBLP]
   DAC, 2006, pp:1083-1088 [Conf]
   
2. Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Wenlong Wei, Kwang-Ting Cheng
   Coverage loss by using space compactors in presence of unknown values. [Citation Graph (0, 0)][DBLP]
   DATE, 2006, pp:1053-1054 [Conf]
   
3. Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng
   Pattern Selection for Testing of Deep Sub-Micron Timing Defects. [Citation Graph (0, 0)][DBLP]
   DATE, 2004, pp:160- [Conf]
   
4. Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
   Response shaper: a novel technique to enhance unknown tolerance for output response compaction. [Citation Graph (0, 0)][DBLP]
   ICCAD, 2005, pp:80-87 [Conf]
   
5. Mango Chia-Tso Chao, Guang-Ming Wu, Iris Hui-Ru Jiang, Yao-Wen Chang
   A clustering- and probability-based approach for time-multiplexed FPGA partitioning. [Citation Graph (0, 0)][DBLP]
   ICCAD, 1999, pp:364-369 [Conf]
   
6. Mango Chia-Tso Chao, Seongmoon Wang, Srimat T. Chakradhar, Kwang-Ting Cheng
   ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values. [Citation Graph (0, 0)][DBLP]
   ICCD, 2005, pp:147-152 [Conf]
   
7. Guang-Ming Wu, Jai-Ming Lin, Mango Chia-Tso Chao, Yao-Wen Chang
   Generic ILP-Based Approaches for Dynamically Reconfigurable FPGA Partitioning. [Citation Graph (0, 0)][DBLP]
   ICCD, 2001, pp:335-347 [Conf]
   
8. Guang-Ming Wu, Mango Chia-Tso Chao, Yao-Wen Chang
   A clustering- and probability-based approach for time-multiplexed FPGA partitioning. [Citation Graph (0, 0)][DBLP]
   Integration, 2004, v:38, n:2, pp:245-265 [Journal]
   
9. 
   Fault models for embedded-DRAM macros. [Citation Graph (, )][DBLP]
   
   
10. 
    A hybrid scheme for compacting test responses with unknown values. [Citation Graph (, )][DBLP]
    
    
11. 
    A metal-only-ECO solver for input-slew and output-loading violations. [Citation Graph (, )][DBLP]
    
    
12. 
    Scan-Chain Reordering for Minimizing Scan-Shift Power Based on Non-Specified Test Cubes. [Citation Graph (, )][DBLP]