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Chin-Chi Teng: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]
Publications of Author
- Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. [Citation Graph (0, 0)][DBLP]
DAC, 1996, pp:548-551 [Conf] - Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. [Citation Graph (0, 0)][DBLP]
DAC, 1996, pp:752-757 [Conf] - Li-Pen Yuan, Chin-Chi Teng, Sung-Mo Kang
Statistical Estimation of Average Power Dissipation in Sequential Circuits. [Citation Graph (0, 0)][DBLP]
DAC, 1997, pp:377-382 [Conf] - Chin-Chi Teng, Anthony M. Hill, Sung-Mo Kang
Estimation of maximum transition counts at internal nodes in CMOS VLSI circuits. [Citation Graph (0, 0)][DBLP]
ICCAD, 1995, pp:366-370 [Conf] - Ching-Long Su, Chin-Chi Teng, Alvin M. Despain
A Study of Cache Hashing Functions for Symbolic Applications in Micro-Parallel Processors. [Citation Graph (0, 0)][DBLP]
ICPADS, 1994, pp:530-537 [Conf] - Li-Pen Yuan, Chin-Chi Teng, Sung-Mo Kang
Statistical estimation of average power dissipation in CMOS VLSI circuits using nonparametric techniques. [Citation Graph (0, 0)][DBLP]
ISLPED, 1996, pp:73-78 [Conf] - Pinhong Chen, Yuji Kukimoto, Chin-Chi Teng, Kurt Keutzer
On convergence of switching windows computation in presence of crosstalk noise. [Citation Graph (0, 0)][DBLP]
ISPD, 2002, pp:84-89 [Conf] - Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. [Citation Graph (0, 0)][DBLP]
IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:8, pp:668-681 [Journal] - Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
iTEM: a temperature-dependent electromigration reliability diagnosis tool. [Citation Graph (0, 0)][DBLP]
IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:8, pp:882-893 [Journal] - Li-Pen Yuan, Chin-Chi Teng, Sung-Mo Kang
Statistical estimation of average power dissipation using nonparametric techniques. [Citation Graph (0, 0)][DBLP]
IEEE Trans. VLSI Syst., 1998, v:6, n:1, pp:65-73 [Journal]
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