|
Search the dblp DataBase
Elyse Rosenbaum:
[Publications]
[Author Rank by year]
[Co-authors]
[Prefers]
[Cites]
[Cited by]
Publications of Author
- Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang
iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. [Citation Graph (0, 0)][DBLP] DAC, 1996, pp:548-551 [Conf]
- Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum
Noise characterization of static CMOS gates. [Citation Graph (0, 0)][DBLP] DAC, 2004, pp:888-893 [Conf]
- Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang
Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. [Citation Graph (0, 0)][DBLP] DAC, 1999, pp:549-554 [Conf]
- Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. [Citation Graph (0, 0)][DBLP] DAC, 1996, pp:752-757 [Conf]
- Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris
Comprehensive frequency-dependent substrate noise analysis using boundary element methods. [Citation Graph (0, 0)][DBLP] ICCAD, 2002, pp:2-9 [Conf]
- Elyse Rosenbaum, Sami Hyvonen
On-chip ESD protection for RF I/Os: devices, circuits and models. [Citation Graph (0, 0)][DBLP] ISCAS (2), 2005, pp:1202-1205 [Conf]
- Rouwaida Kanj, Elyse Rosenbaum
A critical look at design guidelines for SOI logic gates. [Citation Graph (0, 0)][DBLP] ISCAS (3), 2002, pp:261-264 [Conf]
- Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang
Interconnect thermal modeling for determining design limits on current density. [Citation Graph (0, 0)][DBLP] ISPD, 1999, pp:172-178 [Conf]
- Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang
Interconnect thermal modeling for accurate simulation of circuittiming and reliability. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:2, pp:197-205 [Journal]
- Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang
ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:8, pp:668-681 [Journal]
- Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris
An automated and efficient substrate noise analysis tool. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:3, pp:454-468 [Journal]
- Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang
iTEM: a temperature-dependent electromigration reliability diagnosis tool. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:8, pp:882-893 [Journal]
- Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric Minami, Khandker Quader, Ping K. Ko, Chenming Hu
Berkeley reliability tools-BERT. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:10, pp:1524-1534 [Journal]
- Rouwaida Kanj, Elyse Rosenbaum
Critical evaluation of SOI design guidelines. [Citation Graph (0, 0)][DBLP] IEEE Trans. VLSI Syst., 2004, v:12, n:9, pp:885-894 [Journal]
- Elyse Rosenbaum, Jie Wu
Trap generation and breakdown processes in very thin gate oxides. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:5, pp:625-632 [Journal]
- Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum
Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:11, pp:1781-1787 [Journal]
- Jie Wu, Patrick Juliano, Elyse Rosenbaum
Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2001, v:41, n:11, pp:1771-1779 [Journal]
- Sopan Joshi, Elyse Rosenbaum
Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:7, pp:1021-1027 [Journal]
- Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum
Comprehensive ESD protection for RF inputs. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2005, v:45, n:2, pp:245-254 [Journal]
Search in 0.004secs, Finished in 0.005secs
|