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Bernard Plessier: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hyunwoo Cho, Gary D. Hachtel, Enrico Macii, Bernard Plessier, Fabio Somenzi
    Algorithms for Approximate FSM Traversal. [Citation Graph (0, 0)][DBLP]
    DAC, 1993, pp:25-30 [Conf]
  2. Hyunwoo Cho, Gary D. Hachtel, Seh-Woong Jeong, Bernard Plessier, Eric M. Schwarz, Fabio Somenzi
    ATPG Aspects of FSM Verification. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1990, pp:134-137 [Conf]
  3. Seh-Woong Jeong, Bernard Plessier, Gary D. Hachtel, Fabio Somenzi
    Extended BDD's: Trading off Canonicity for Structure in Verification Algorithms. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:464-467 [Conf]
  4. Seon-Woong Jeong, Bernard Plessier, Gary D. Hachtel, Fabio Somenzi
    Variable Ordering and Selection for FSM Traversal. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1991, pp:476-479 [Conf]
  5. Enrico Macii, Bernard Plessier, Fabio Somenzi
    Verification of systems containing counters. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1992, pp:179-182 [Conf]
  6. Shipra Panda, Fabio Somenzi, Bernard Plessier
    Symmetry detection and dynamic variable ordering of decision diagrams. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1994, pp:628-631 [Conf]
  7. Bernard Plessier, Gary D. Hachtel, Fabio Somenzi
    Extended BDDs: Trading off Canonicity for Structure in Verification Algorithms. [Citation Graph (0, 0)][DBLP]
    Formal Methods in System Design, 1994, v:4, n:2, pp:167-185 [Journal]
  8. Hyunwoo Cho, Gary D. Hachtel, Enrico Macii, Bernard Plessier, Fabio Somenzi
    Algorithms for approximate FSM traversal based on state space decomposition. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:12, pp:1465-1478 [Journal]
  9. Enrico Macii, Bernard Plessier, Fabio Somenzi
    Formal verification of digital systems by automatic reduction of data paths. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1997, v:16, n:10, pp:1136-1156 [Journal]

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