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Publications of Author

1. Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
   Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. [Citation Graph (0, 0)][DBLP]
   DAC, 2005, pp:857-862 [Conf]
   
2. Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
   March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. [Citation Graph (0, 0)][DBLP]
   DDECS, 2006, pp:256-261 [Conf]
   
3. A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
   Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. [Citation Graph (0, 0)][DBLP]
   VTS, 2007, pp:361-368 [Conf]
   
4. A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
   Slow write driver faults in 65nm SRAM technology: analysis and March test solution. [Citation Graph (0, 0)][DBLP]
   DATE, 2007, pp:528-533 [Conf]
   
5. A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
   Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. [Citation Graph (0, 0)][DBLP]
   European Test Symposium, 2007, pp:97-104 [Conf]
   
6. 
   A Design-for-Diagnosis Technique for SRAM Write Drivers. [Citation Graph (, )][DBLP]
   
   
7. 
   A new design-for-test technique for SRAM core-cell stability faults. [Citation Graph (, )][DBLP]
   
   
8. 
   A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. [Citation Graph (, )][DBLP]
   
   
9. 
   Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. [Citation Graph (, )][DBLP]
   
   
10. 
    An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. [Citation Graph (, )][DBLP]