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Magali Bastian: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
    Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies. [Citation Graph (0, 0)][DBLP]
    DAC, 2005, pp:857-862 [Conf]
  2. Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
    March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit. [Citation Graph (0, 0)][DBLP]
    DDECS, 2006, pp:256-261 [Conf]
  3. A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
    Un-Restored Destructive Write Faults Due to Resistive-Open Defects in the Write Driver of SRAMs. [Citation Graph (0, 0)][DBLP]
    VTS, 2007, pp:361-368 [Conf]
  4. A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
    Slow write driver faults in 65nm SRAM technology: analysis and March test solution. [Citation Graph (0, 0)][DBLP]
    DATE, 2007, pp:528-533 [Conf]
  5. A. Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
    Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs. [Citation Graph (0, 0)][DBLP]
    European Test Symposium, 2007, pp:97-104 [Conf]

  6. A Design-for-Diagnosis Technique for SRAM Write Drivers. [Citation Graph (, )][DBLP]


  7. A new design-for-test technique for SRAM core-cell stability faults. [Citation Graph (, )][DBLP]


  8. A Novel Dummy Bitline Driver for Read Margin Improvement in an eSRAM. [Citation Graph (, )][DBLP]


  9. Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. [Citation Graph (, )][DBLP]


  10. An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing. [Citation Graph (, )][DBLP]


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