Imad A. Ferzli, Farid N. Najm Statistical estimation of leakage-induced power grid voltage drop considering within-die process variations. [Citation Graph (0, 0)][DBLP] DAC, 2003, pp:856-859 [Conf]
Imad A. Ferzli, Farid N. Najm Analysis and verification of power grids considering process-induced leakage-current variations. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2006, v:25, n:1, pp:126-143 [Journal]
A geometric approach for early power grid verification using current constraints. [Citation Graph (, )][DBLP]
Early power grid verification under circuit current uncertainties. [Citation Graph (, )][DBLP]
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