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Publications of Author

1. Jörg Hilgenstock, Klaus Herrmann, Jan Otterstedt, Dirk Niggemeyer, Peter Pirsch
   A Video Signal Processor for MIMD Multiprocessing. [Citation Graph (0, 0)][DBLP]
   DAC, 1998, pp:50-55 [Conf]
   
2. Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick
   Diagnostic Testing of Embedded Memories Using BIST. [Citation Graph (0, 0)][DBLP]
   DATE, 2000, pp:305-0 [Conf]
   
3. Dirk Niggemeyer, M. Rüffer
   Parametric Built-In Self-Test of VLSI Systems. [Citation Graph (0, 0)][DBLP]
   DATE, 1999, pp:376-0 [Conf]
   
4. Petra Nordholz, Hartmut Grabinski, Dieter Treytnar, Jan Otterstedt, Dirk Niggemeyer, Uwe Arz, T. W. Williams
   Core Interconnect Testing Hazards. [Citation Graph (0, 0)][DBLP]
   DATE, 1998, pp:953-954 [Conf]
   
5. Markus Rudack, Dirk Niggemeyer
   Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM. [Citation Graph (0, 0)][DBLP]
   DFT, 1999, pp:31-39 [Conf]
   
6. Jan Otterstedt, Dirk Niggemeyer, T. W. Williams
   Detection of CMOS address decoder open faults with March and pseudo random memory tests. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:53-62 [Conf]
   
7. Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Redeker
   Diagnostic Testing of Embedded Memories Based on Output Tracing. [Citation Graph (0, 0)][DBLP]
   MTDT, 2000, pp:113-118 [Conf]
   
8. Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer
   Using GLFSRs for Pseudo-Random Memory BIST. [Citation Graph (0, 0)][DBLP]
   MTDT, 2000, pp:85-94 [Conf]
   
9. Dirk Niggemeyer, Elizabeth M. Rudnick
   Automatic Generation of Diagnostic March Tests. [Citation Graph (0, 0)][DBLP]
   VTS, 2001, pp:299-305 [Conf]
   
10. Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams
    Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. [Citation Graph (0, 0)][DBLP]
    VTS, 1998, pp:28-33 [Conf]
    
11. Dirk Niggemeyer, Elizabeth M. Rudnick
    Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 2004, v:53, n:9, pp:1134-1146 [Journal]
    
12. Dirk Niggemeyer, Elizabeth M. Rudnick
    A data acquisition methodology for on-chip repair of embedded memories. [Citation Graph (0, 0)][DBLP]
    ACM Trans. Design Autom. Electr. Syst., 2003, v:8, n:4, pp:560-576 [Journal]