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Publications of Author

1. Wanli Jiang, Bapiraju Vinnakota
   IC Test Using the Energy Consumption Ratio. [Citation Graph (0, 0)][DBLP]
   DAC, 1999, pp:976-981 [Conf]
   
2. Dechang Sun, Bapiraju Vinnakota, Wanli Jiang
   Fast State Verification. [Citation Graph (0, 0)][DBLP]
   DAC, 1998, pp:619-624 [Conf]
   
3. Wanli Jiang, Erik Peterson, Bob Robotka
   Effectiveness Improvement of ECR Tests. [Citation Graph (0, 0)][DBLP]
   ITC, 2003, pp:699-708 [Conf]
   
4. Wanli Jiang, Bapiraju Vinnakota
   Statistical threshold formulation for dynamic I_dd test. [Citation Graph (0, 0)][DBLP]
   ITC, 1999, pp:57-66 [Conf]
   
5. Erik Peterson, Wanli Jiang
   Practical application of energy consumption ratio test. [Citation Graph (0, 0)][DBLP]
   ITC, 2001, pp:386-394 [Conf]
   
6. Bapiraju Vinnakota, Wanli Jiang, Dechang Sun
   Process-tolerant test with energy consumption ratio. [Citation Graph (0, 0)][DBLP]
   ITC, 1998, pp:1027-1036 [Conf]
   
7. Wanli Jiang, Erik Peterson
   Performance Comparison of VLV, ULV, and ECR Tests. [Citation Graph (0, 0)][DBLP]
   VTS, 2002, pp:31-36 [Conf]
   
8. Wanli Jiang, Bapiraju Vinnakota
   Defect-Oriented Test Scheduling. [Citation Graph (0, 0)][DBLP]
   VTS, 1999, pp:433-439 [Conf]
   
9. Wanli Jiang, Bapiraju Vinnakota
   IC test using the energy consumption ratio. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:1, pp:129-141 [Journal]
   
10. Wanli Jiang, Bapiraju Vinnakota
    Statistical threshold formulation for dynamic I_dd test. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:6, pp:694-705 [Journal]
    
11. Wanli Jiang, Bapiraju Vinnakota
    Defect-oriented test scheduling. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. VLSI Syst., 2001, v:9, n:3, pp:427-438 [Journal]