The SCEAS System
Navigation Menu

Search the dblp DataBase

Title:
Author:

Haluk Konuk: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Haluk Konuk, F. Joel Ferguson, Tracy Larrabee
    Accurate and Efficient Fault Simulation of Realistic CMOS Network Breaks. [Citation Graph (0, 0)][DBLP]
    DAC, 1995, pp:345-351 [Conf]
  2. Christos A. Papachristou, Haluk Konuk
    A Linear Program Driven Scheduling and Allocation Method Followed by an Interconnect Optimization Algorithm. [Citation Graph (0, 0)][DBLP]
    DAC, 1990, pp:77-83 [Conf]
  3. Haluk Konuk
    Fault simulation of interconnect opens in digital CMOS circuits. [Citation Graph (0, 0)][DBLP]
    ICCAD, 1997, pp:548-554 [Conf]
  4. Haluk Konuk
    On invalidation mechanisms for non-robust delay tests. [Citation Graph (0, 0)][DBLP]
    ITC, 2000, pp:393-399 [Conf]
  5. Haluk Konuk, F. Joel Ferguson
    Oscillation and Sequential Behavior Caused by Interconnect Opens in Digital CMOS Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1997, pp:597-606 [Conf]
  6. Haluk Konuk, Leon Xiao
    DFFT : Design For Functional Testability. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:1105-1114 [Conf]
  7. Bill Underwood, Wai-on Law, Sungho Kang, Haluk Konuk
    Fastpath: A Path-Delay Test Generator for Standard Scan Designs. [Citation Graph (0, 0)][DBLP]
    ITC, 1994, pp:154-163 [Conf]
  8. C.-H. Chia, Sujit Dey, Faraydon Karim, Haluk Konuk, Keesup Kim
    Validation and Test of Network Processors and ASICs. [Citation Graph (0, 0)][DBLP]
    VTS, 2002, pp:407-410 [Conf]
  9. Haluk Konuk, F. Joel Ferguson
    An unexpected factor in testing for CMOS opens: the die surface. [Citation Graph (0, 0)][DBLP]
    VTS, 1996, pp:422-429 [Conf]
  10. Haluk Konuk
    Voltage- and current-based fault simulation for interconnect open defects. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:12, pp:1768-1779 [Journal]
  11. Haluk Konuk, F. Joel Ferguson
    Oscillation and sequential behavior caused by opens in the routing in digital CMOS circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1998, v:17, n:11, pp:1200-1210 [Journal]
  12. Haluk Konuk, F. Joel Ferguson, Tracy Larrabee
    Charge-based fault simulation for CMOS network breaks. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:12, pp:1555-1567 [Journal]

Search in 0.001secs, Finished in 0.002secs
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002