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Grzegorz Mrugalski:
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- Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer
Test response compactor with programmable selector. [Citation Graph (0, 0)][DBLP] DAC, 2006, pp:1089-1094 [Conf]
- Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski
Synthesis of pattern generators based on cellular automata with phase shifters. [Citation Graph (0, 0)][DBLP] ITC, 1999, pp:368-377 [Conf]
- Grzegorz Mrugalski, Chen Wang, Artur Pogiel, Jerzy Tyszer, Janusz Rajski
Fault Diagnosis in Designs with Convolutional Compactors. [Citation Graph (0, 0)][DBLP] ITC, 2004, pp:498-507 [Conf]
- Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian
Embedded Deterministic Test for Low-Cost Manufacturing Test. [Citation Graph (0, 0)][DBLP] ITC, 2002, pp:301-310 [Conf]
- Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer
Planar High Performance Ring Generators. [Citation Graph (0, 0)][DBLP] VTS, 2004, pp:193-198 [Conf]
- Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer
High Speed Ring Generators and Compactors of Test Data. [Citation Graph (0, 0)][DBLP] VTS, 2003, pp:57-62 [Conf]
- Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski
Linear Independence as Evaluation Criterion for Two-Dimensional Test Pattern Generators. [Citation Graph (0, 0)][DBLP] VTS, 2000, pp:377-388 [Conf]
- Janusz Rajski, Grzegorz Mrugalski, Jerzy Tyszer
Comparative Study of CA-based PRPGs and LFSRs with Phase Shifters. [Citation Graph (0, 0)][DBLP] VTS, 1999, pp:236-245 [Conf]
- Dariusz Czysz, Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer
Low Power Embedded Deterministic Test. [Citation Graph (0, 0)][DBLP] VTS, 2007, pp:75-83 [Conf]
- Grzegorz Mrugalski, Jerzy Tyszer, Janusz Rajski
2D Test Sequence Generators. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2003, v:20, n:1, pp:51-59 [Journal]
- Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer
High Performance Dense Ring Generators. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 2006, v:55, n:1, pp:83-87 [Journal]
- Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer
Cellular automata-based test pattern generators with phase shifters. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2000, v:19, n:8, pp:878-893 [Journal]
- Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer
Ring generators - new devices for embedded test applications. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2004, v:23, n:9, pp:1306-1320 [Journal]
- Grzegorz Mrugalski, Janusz Rajski, Dariusz Czysz, Jerzy Tyszer
New Test Data Decompressor for Low Power Applications. [Citation Graph (0, 0)][DBLP] DAC, 2007, pp:539-544 [Conf]
- Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer
Isolation of Failing Scan Cells through Convolutional Test Response Compaction. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2007, v:23, n:1, pp:35-45 [Journal]
Diagnosis of failing scan cells through orthogonal response compaction. [Citation Graph (, )][DBLP]
X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis. [Citation Graph (, )][DBLP]
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