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Jason G. Brown: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton
    Multiple-detect ATPG based on physical neighborhoods. [Citation Graph (0, 0)][DBLP]
    DAC, 2006, pp:1099-1102 [Conf]
  2. Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton
    Extraction of defect density and size distributions from wafer sort test results. [Citation Graph (0, 0)][DBLP]
    DATE, 2006, pp:913-918 [Conf]
  3. Jason G. Brown, R. D. (Shawn) Blanton
    CAEN-BIST: Testing the NanoFabric. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:462-471 [Conf]
  4. Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, V. Rovner, S. Tiwary
    Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. [Citation Graph (0, 0)][DBLP]
    ITC, 2004, pp:508-517 [Conf]
  5. Jason G. Brown, R. D. (Shawn) Blanton
    Exploiting Regularity for Inductive Fault Analysis. [Citation Graph (0, 0)][DBLP]
    VTS, 2006, pp:364-369 [Conf]
  6. Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer
    Extracting Defect Density and Size Distributions from Product ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:5, pp:390-400 [Journal]
  7. Jason G. Brown, R. D. (Shawn) Blanton
    A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2007, v:23, n:2-3, pp:131-144 [Journal]

  8. Automated Testability Enhancements for Logic Brick Libraries. [Citation Graph (, )][DBLP]


  9. Automated Standard Cell Library Analysis for Improved Defect Modeling. [Citation Graph (, )][DBLP]


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