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Charles E. Radke :
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David M. Wu , Charles E. Radke Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits. [Citation Graph (0, 0)][DBLP ] DAC, 1991, pp:291-295 [Conf ] C. C. Beh , K. H. Arya , Charles E. Radke , E. Kofi Vida-Torku Do Stuck Fault Models Reflect Manufacturing Defects? [Citation Graph (0, 0)][DBLP ] ITC, 1982, pp:35-42 [Conf ] E. Kofi Vida-Torku , James A. Monzel , Charles E. Radke Performance Assurance of Memories Embedded in VLSI Chips. [Citation Graph (0, 0)][DBLP ] ITC, 1986, pp:154-160 [Conf ] David M. Wu , Charles E. Radke , C. C. Beh Improve Yield and Quality Through Testability Analysis of VLSI Circuits. [Citation Graph (0, 0)][DBLP ] ITC, 1984, pp:713-717 [Conf ] David M. Wu , Charles E. Radke , J. P. Roth Statistical AC Test Coverage. [Citation Graph (0, 0)][DBLP ] ITC, 1986, pp:538-541 [Conf ] Charles E. Radke Enumeration of Strongly Connected Sequential Machines [Citation Graph (0, 0)][DBLP ] Information and Control, 1965, v:8, n:4, pp:377-389 [Journal ] Charles E. Radke Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy [Citation Graph (0, 0)][DBLP ] Information and Control, 1966, v:9, n:3, pp:279-284 [Journal ] Charles E. Radke Merge-Sort Analysis by Matrix Techniques. [Citation Graph (0, 0)][DBLP ] IBM Systems Journal, 1966, v:5, n:4, pp:226-247 [Journal ] Search in 0.003secs, Finished in 0.003secs