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Peter Sandborn: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Daniel Ragan, Peter Sandborn, Paul Stoaks
    A detailed cost model for concurrent use with hardware/software co-design. [Citation Graph (0, 0)][DBLP]
    DAC, 2002, pp:269-274 [Conf]
  2. Zhen Shi, Peter Sandborn
    Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. [Citation Graph (0, 0)][DBLP]
    ITC, 2003, pp:937-946 [Conf]
  3. Thiagarajan Trichy, Peter Sandborn, Ravi Raghavan, Shubhada Sahasrabudhe
    A new test/diagnosis/rework model for use in technical cost modeling of electronic systems assembly. [Citation Graph (0, 0)][DBLP]
    ITC, 2001, pp:1108-1117 [Conf]
  4. Magdy S. Abadir, Ashish R. Parikh, Linda Bal, Peter Sandborn, Ken Drake
    Analyzing Multichip Module Testing Strategies. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1994, v:11, n:1, pp:40-52 [Journal]
  5. Peter Sandborn, Mike Vertal
    Analyzing Packaging Trade-Offs During System Design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:10-19 [Journal]
  6. Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht
    Process capability indices and product reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:12, pp:2067-2070 [Journal]
  7. Zhen Shi, Peter Sandborn
    Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. [Citation Graph (0, 0)][DBLP]
    J. Electronic Testing, 2006, v:22, n:1, pp:49-60 [Journal]

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