Zhen Shi, Peter Sandborn Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic Systems Assembly Using Real-Coded Genetic Algorithms. [Citation Graph (0, 0)][DBLP] ITC, 2003, pp:937-946 [Conf]
Zhen Shi, Peter Sandborn Optimization of Test/Diagnosis/Rework Location(s) and Characteristics in Electronic System Assembly. [Citation Graph (0, 0)][DBLP] J. Electronic Testing, 2006, v:22, n:1, pp:49-60 [Journal]
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