Bernhard H. Seiß, Michael H. Schulz Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen. [Citation Graph (0, 0)][DBLP] Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, 1990, pp:195-206 [Conf]
Kurt Antreich, Michael H. Schulz Accelerated Fault Simulation and Fault Grading in Combinational Circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:5, pp:704-712 [Journal]
Karl Fuchs, Franz Fink, Michael H. Schulz DYNAMITE: an efficient automatic test pattern generation system for path delay faults. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:10, pp:1323-1335 [Journal]
Michael H. Schulz, Elisabeth Auth Improved deterministic test pattern generation with applications to redundancy identification. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1989, v:8, n:7, pp:811-816 [Journal]