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Michael H. Schulz: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Michael H. Schulz, Franz Fink, Karl Fuchs
    Parallel Pattern Fault Simulation of Path Delay Faults. [Citation Graph (0, 0)][DBLP]
    DAC, 1989, pp:357-363 [Conf]
  2. Thomas M. Sarfert, Remo G. Markgraf, Erwin Trischler, Michael H. Schulz
    Hierarchical Test Pattern Generation Based on High-Level Primitives. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:470-479 [Conf]
  3. Michael H. Schulz, Elisabeth Auth
    Essential: An Efficient Self-Learning Test Pattern Generation Algorithm for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    ITC, 1989, pp:28-37 [Conf]
  4. Bernhard H. Seiß, Michael H. Schulz
    Ein neues, effizientes Verfahren zum Testpunkteeinbau in kombinatorischen Schaltungen. [Citation Graph (0, 0)][DBLP]
    Rechnergestützter Entwurf und Architektur mikroelektronischer Systeme, 1990, pp:195-206 [Conf]
  5. Elisabeth Auth, Michael H. Schulz
    A Test-Pattern-Generation Algorithm for Sequential Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1991, v:8, n:2, pp:72-86 [Journal]
  6. Hans-Joachim Wunderlich, Michael H. Schulz
    Prüfgerechter Entwurf und Test hochintegrierter Schaltungen. [Citation Graph (0, 0)][DBLP]
    Informatik Spektrum, 1992, v:15, n:1, pp:23-32 [Journal]
  7. Franz Fink, Karl Fuchs, Michael H. Schulz
    Robust and Nonrobust Path Delay Fault Simulation by Parallel Processing of Patterns. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1992, v:41, n:12, pp:1527-1536 [Journal]
  8. Kurt Antreich, Michael H. Schulz
    Accelerated Fault Simulation and Fault Grading in Combinational Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1987, v:6, n:5, pp:704-712 [Journal]
  9. Karl Fuchs, Franz Fink, Michael H. Schulz
    DYNAMITE: an efficient automatic test pattern generation system for path delay faults. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1991, v:10, n:10, pp:1323-1335 [Journal]
  10. Thomas M. Sarfert, Remo G. Markgraf, Michael H. Schulz, Erwin Trischler
    A hierarchical test pattern generation system based on high-level primitives. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1992, v:11, n:1, pp:34-44 [Journal]
  11. Michael H. Schulz, Elisabeth Auth
    Improved deterministic test pattern generation with applications to redundancy identification. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1989, v:8, n:7, pp:811-816 [Journal]
  12. Michael H. Schulz, Erwin Trischler, Thomas M. Sarfert
    SOCRATES: a highly efficient automatic test pattern generation system. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1988, v:7, n:1, pp:126-137 [Journal]

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