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Hsi-Ching Shih: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Publications of Author

  1. Hsi-Ching Shih, Jacob A. Abraham
    Transistor-level test generation for physical failures in CMOS circuits. [Citation Graph (0, 0)][DBLP]
    DAC, 1986, pp:243-249 [Conf]
  2. Hsi-Ching Shih, Joseph T. Rahmeh, Jacob A. Abraham
    FAUST: An MOS Fault Simulator with Timing Information. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. on CAD of Integrated Circuits and Systems, 1986, v:5, n:4, pp:557-563 [Journal]

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