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Michael Campbell:
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Publications of Author
- Andreas J. Strojwas, Michael Campbell, Vassilios Gerousis, Jim Hogan, John Kibarian, Marc Levitt, Walter Ng, Dipu Pramanik, Mark Templeton
When IC yield missed the target, who is at fault? [Citation Graph (0, 0)][DBLP] DAC, 2004, pp:80- [Conf]
The Future of Test - Product Integration and its Impact on Test. [Citation Graph (, )][DBLP]
Parallel Mesh Adaptation for Highly Evolving Geometries with Application to Solid Propellant Rockets. [Citation Graph (, )][DBLP]
Plenary presentations: Keynote: The product complexity and test - How product complexity impacts test industry. [Citation Graph (, )][DBLP]
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